Knapp, Steve
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1

Effective Irradiance Monitoring Using Reference Modules:

, In: 2022 IEEE 49th Photovoltaics Specialists Conference (PVSC),
Braid, Jennifer L. ; Stein, Joshua S. ; King, Bruce H.... - p. 1073-1078 , 2022
 
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2

Applications of Matchmoving for Forensic Video Analysis of ..:

Ziernicki, Richard ; Gordon, Martin ; Knapp, Steve.
Journal of the National Academy of Forensic Engineers.  38 (2021)  1 - p. , 2021
 
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3

Applications of Matchmoving for Forensic Video Analysis of ..:

Ziernicki, Richard ; Gordon, Martin ; Knapp, Steve.
Journal of the National Academy of Forensic Engineers.  38 (2021)  1 - p. , 2021
 
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5

Deep sequencing analysis of the transcriptomes of peanut ae..:

Chen, Xiaoping ; Zhu, Wei ; Azam, Sarwar...
Plant Biotechnology Journal.  11 (2012)  1 - p. 115-127 , 2012
 
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6

The selection and characterization of antibodies to minichr..:

Henderson, Dorian ; Hall, Laura ; Prpic, Nikki...
Journal of Immunological Methods.  370 (2011)  1-2 - p. 1-13 , 2011
 
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7

Fair trade at the centre of development:

, In: Fair trade, corporate accountability and beyond / ed. by Kate Macdonald ...
Knapp, Steve. (2010)  - p. 37-55
Copies:  Juridicum: h jur 027 jhm/185
 
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11

Session details: Will power kill FPGAs?:

, In: Proceedings of the 2006 ACM/SIGDA 14th international symposium on Field programmable gate arrays,
 
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12

Phase planning today ; Planificación por fases ahora:

Knapp, Steve ; Charron, Roberto ; Howell, Gregory
https://ojs.uc.cl/index.php/ric/article/view/16759/13703.  , 2020
 
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13

Phase planning today Planificación por fases ahora:

Steve Knapp ; Roberto Charron ; Gregory Howell
http://www.scielo.cl/scielo.php?script=sci_arttext&pid=S0718-50732007000300002.  , 2007
 
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14

Achieving wetting in molten lead for ultrasonic application:

Hawes, Jonathan ; Knapp, Jordan ; Burrows, Robert...
Nuclear Engineering and Technology.  56 (2024)  2 - p. 437-443 , 2024
 
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15

Demonstration of an ultrasonic imaging system for molten le..:

Hawes, Jonathan ; Knapp, Jordan ; Burrows, Robert...
Nuclear Engineering and Technology.  56 (2024)  4 - p. 1460-1471 , 2024
 
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