Ko, KwangMin
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6

A Comprehensive Study of Read-After-Write-Delay for Ferroel..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Myeong, Ilho ; Lim, Suhwan ; Kim, Taeyoung... - p. 9B.3-1-9B.3-6 , 2024
 
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Comprehensive Design Guidelines of Gate Stack for QLC and H..:

, In: 2023 International Electron Devices Meeting (IEDM),
Lim, Suhwan ; Kim, Taeyoung ; Myeong, Ilho... - p. 1-4 , 2023
 
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11

A Study on Trauma Mechanisms and Injury Sites in Patients w..:

Choi, YoungUn ; Kim, SuHyun ; Ko, JiWool...
Emergency Medicine International.  2022 (2022)  - p. 1-9 , 2022
 
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15

20.3 A 4.0×3.7×1.0mm3-MEMS CMOS Integrated E-Nose with Embe..:

, In: 2020 IEEE International Solid- State Circuits Conference - (ISSCC),
Lee, Si Hoon ; Park, Kwangmin ; Lim, Jaeheung... - p. 316-318 , 2020
 
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