Kolosiuk, A.G
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Mechanism of Annealing of VO Defects in n-Si Under Pulse El..:

Kraitchinskii, A.M ; Kras'ko, M.M ; Kolosiuk, A.G...
https://ujp.bitp.kiev.ua/index.php/ujp/article/view/2022028/2247.  , 2022
 
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Effect of Tin on Structural Transformations in the Thin-Fil..:

Voitovych, V. V ; Rudenko, R. M ; Yuchymchuk, V. O...
https://ujp.bitp.kiev.ua/index.php/ujp/article/view/2019014/890.  , 2019
 
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