Koskinen, Matthew
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1

Voltage Ramp Stress Test Optimization for Wafer Level Hot C..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Zhao, Ri-an ; Koskinen, Matthew ; Liu, Yang. - p. 1-6 , 2023
 
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4

Radiation and temperature drive diurnal variation of aerobi..:

Kohl, Lukas ; Tenhovirta, Salla A. M. ; Koskinen, Markku...
Proceedings of the National Academy of Sciences.  120 (2023)  52 - p. , 2023
 
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5

Extreme Path Delay Estimation of Critical Paths in Within-D..:

Runolinna, Miikka ; Turnquist, Matthew ; Teittinen, Jukka..
Journal of Low Power Electronics and Applications.  13 (2023)  1 - p. 22 , 2023
 
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A 0.4-0.9V, 2.87pJ/cycle Near-Threshold ARM Cortex-M3 CPU w..:

, In: 2020 IEEE Symposium in Low-Power and High-Speed Chips (COOL CHIPS),
 
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Development of a common scale for measuring healthy ageing ..:

Sanchez-Niubo, Albert ; Forero, Carlos G ; Wu, Yu-Tzu...
International Journal of Epidemiology.  50 (2020)  3 - p. 880-892 , 2020
 
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14

Cohort Profile: The Ageing Trajectories of Health – Longitu..:

Sanchez-Niubo, Albert ; Egea-Cortés, Laia ; Olaya, Beatriz...
International Journal of Epidemiology.  48 (2019)  4 - p. 1052-1053i , 2019
 
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