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Kourfali, Alexandra
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1

Pattern Generation for Efficient Acceptability Verification..:

, In: 2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA),
Chao, Wei-Ji ; Kourfali, Alexandra ; Lylina, Natalia... - p. 1-4 , 2024
Link: https://doi.org/10.1109/..
 
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2

Guardband Optimization for the Preconditioned Conjugate Gra..:

, In: 2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W),
Lylina, Natalia ; Holst, Stefan ; Jafarzadeh, Hanieh.. - p. 195-198 , 2023
Link: https://doi.org/10.1109/..
 
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3

Test Aspects of System Health State Monitoring:

, In: 2023 IEEE 24th Latin American Test Symposium (LATS),
Wunderlich, Hans-Joachim ; Jafarzadeh, Hanieh ; Kourfali, Alexandra.. - p. 1-2 , 2023
Link: https://doi.org/10.1109/..
 
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4

Special Issue: "Approximation at the Edge":

Bosio, Alberto ; Dolecek, Lara ; Kourfali, Alexandra..
ACM Transactions on Embedded Computing Systems.  22 (2023)  4 - p. 1-4 , 2023
Link: https://doi.org/10.1145/..
 
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5

Exploiting the Error Resilience of the Preconditioned Conju..:

, In: 2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS),
Lylina, Natalia ; Holst, Stefan ; Jafarzadeh, Hanieh.. - p. 1-7 , 2023
Link: https://doi.org/10.1109/..
 
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6

In-Circuit Debugging with Dynamic Reconfiguration of FPGA I..:

Kourfali, Alexandra ; Stroobandt, Dirk
ACM Transactions on Reconfigurable Technology and Systems.  13 (2020)  1 - p. 1-29 , 2020
Link: https://doi.org/10.1145/..
 
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7

In-Circuit Debugging with Dynamic Reconfiguration of FPGA I..:

Kourfali, Alexandra ; Stroobandt, Dirk
ACM Transactions on Reconfigurable Technology and Systems (TRETS).  13 (2020)  1 - p. 1-29 , 2020
Link: https://dl.acm.org/doi/1..
 
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8

In-circuit fault tolerance for FPGAs using dynamic reconfig..:

Kourfali, Alexandra ; Stroobandt, Dirk
Microelectronics Reliability.  102 (2019)  - p. 113438 , 2019
Link: https://doi.org/10.1016/..
 
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9

An Integrated on-Silicon Verification Method for FPGA Overl..:

Kourfali, Alexandra ; Fricke, Florian ; Huebner, Michael.
Journal of Electronic Testing.  35 (2019)  2 - p. 173-189 , 2019
Link: https://doi.org/10.1007/..
 
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