Kowalsky, Jens
18  results:
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1

Current filament behavior in IGBTs of different voltage cla..:

, In: 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD),
 
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2

Short Circuit Robustness of an Aged High Power IGBT-Module:

, In: 2019 21st European Conference on Power Electronics and Applications (EPE '19 ECCE Europe),
 
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3

Structure and Switching Behavior Optimization of fast 4.5 k..:

, In: 2019 21st European Conference on Power Electronics and Applications (EPE '19 ECCE Europe),
Zhi, Zheng ; Kowalsky, Jens ; Lutz, Josef... - p. P.1-P.10 , 2019
 
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4

A Clamping Circuit for Short Circuit Ruggedness Improvement..:

, In: 2019 20th International Symposium on Power Electronics (Ee),
Liu, Xing ; Kowalsky, Jens ; Lutz, Josef - p. 1-6 , 2019
 
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5

Temperature determination of SiC MPS diodes during surge cu..:

, In: 2019 21st European Conference on Power Electronics and Applications (EPE '19 ECCE Europe),
 
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10

The Role of Transition Metal Oxides in Charge‐Generation La..:

Hamwi, Sami ; Meyer, Jens ; Kröger, Michael...
Advanced Functional Materials.  20 (2010)  11 - p. 1762-1766 , 2010
 
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11

Reliability aspects of organic light emitting diodes:

, In: 2010 IEEE International Reliability Physics Symposium,
Riedl, Thomas ; Winkler, Thomas ; Schmidt, Hans... - p. 327-333 , 2010
 
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14

P‐157: Highly‐Efficient Gas Diffusion Barriers Based on Nan..:

Meyer, Jens ; Schneidenbach, Daniel ; Görrn, Patrick...
SID Symposium Digest of Technical Papers.  40 (2009)  1 - p. 1706-1709 , 2009
 
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