Krajňák, Tomáš
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1

Robust Dipolar Layers between Organic Semiconductors and Si..:

Krajňák, Tomáš ; Stará, Veronika ; Procházka, Pavel...
ACS Applied Materials & Interfaces.  16 (2024)  14 - p. 18099-18111 , 2024
 
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5

Thermal stability of dislocation structure and its effect o..:

Li, Ying ; Krajňák, Tomáš ; Podaný, Pavel..
Materials Science and Engineering: A.  873 (2023)  - p. 144981 , 2023
 
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8

Investigation of short-term creep properties of a coarse-gr..:

Li, Ying ; Dlouhý, Jaromír ; Vavřík, Jaroslav...
Materials Science and Engineering: A.  844 (2022)  - p. 143143 , 2022
 
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