Krakers, Max
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Reverse breakdown and light-emission patterns studied in Si..:

, In: 2019 42nd International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO),
Krakers, Max ; Kneevic, T. ; Nanver, L. K. - p. 30-35 , 2019
 
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Optoelectrical Operation Stability of Broadband PureGaB Ge-..:

Krakers, Max ; Knežević, Tihomir ; Nanver, Lis K
https://vbn.aau.dk/da/publications/680e85e0-974a-4917-8a18-4dbe2eeba39e.  , 2021
 
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