Krattenmacher, Mario
13  results:
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2

FOSS CAD for the Compact Verilog-A Model Standardization in..:

, In: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
 
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A W-band Class-F234 SiGe-HBT Power Amplifier with 35/19.7% ..:

, In: 2023 18th European Microwave Integrated Circuits Conference (EuMIC),
 
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Physics-Based Compact Modeling of the Transfer Current in I..:

, In: 2023 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS),
 
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Device modeling tools and their application to SiGe HBT dev..:

, In: 2022 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS),
 
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Methods for Extracting the Temperature- and Power-Dependent..:

Muller, Markus ; d'Alessandro, Vincenzo ; Falk, Sophia...
IEEE Transactions on Electron Devices.  69 (2022)  8 - p. 4064-4074 , 2022
 
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Thermal impedance of SiGe HBTs: Characterization and modeli..:

, In: 2022 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS),
 
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13

Genetic and genomic characterization followed by single-ste..:

Vosgerau, Sarah ; Krattenmacher, Nina ; Falker-Gieske, Clemens...
Journal of applied genetics -- J Appl Genet -- 2194407-6 -- 2190-3883 -- 1234-1983 -- https://www.springer.com/journal/13353 -- https://ezb.uni-regensburg.de/ezeit/detail.phtml?bibid=TIHO&colors=7&lang=de&jour_id=151109.  , 2022
 
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