E-LIB Suche - Ergebnisse für: Kruit, Pieter

1

A new approach for fast field calculation in electrostatic ..:

Hesam Mahmoudi Nezhad, Neda ; Ghaffarian Niasar, Mohamad ; Hagen, Cornelis W..
Scientific Reports. 14 (2024) 1 - p. , 2024

Link: https://doi.org/10.1038/..

2

Tuning Parameters in the Genetic Algorithm Optimization of ..:

, In: 2023 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO),

Nezhad, Neda Hesam Mahmoudi ; Niasar, Mohamad Ghaffarian ; Hagen, Cornelis W.. - p. 170-173 , 2023

Link: https://doi.org/10.1109/..

3

Comparison of Different Optimization Techniques in Electron..:

, In: 2023 9th International Conference on Optimization and Applications (ICOA),

Nezhad, Neda Hesam Mahmoudi ; Niasar, Mohamad Ghaffarian ; Hagen, Cornelis Wouter. - p. 1-5 , 2023

Link: https://doi.org/10.1109/..

4

Imaging resonant micro-cantilever movement with ultrafast s..:

Garming, Mathijs W. H. ; Kruit, Pieter ; Hoogenboom, Jacob P.
Review of Scientific Instruments. 93 (2022) 9 - p. , 2022

Link: https://doi.org/10.1063/..

5

Interaction-Free Measurement with Electrons:

Turner, Amy E. ; Johnson, Cameron W. ; Kruit, Pieter.
Physical Review Letters. 127 (2021) 11 - p. , 2021

Link: https://doi.org/10.1103/..

6

Electrostatic electron mirror in SEM for simultaneous imagi..:

Abedzadeh, Navid ; Krielaart, M.A.R. ; Kim, Chung-Soo...
Ultramicroscopy. 226 (2021) - p. 113304 , 2021

Link: https://doi.org/10.1016/..

7

Trajectory displacement in a multi beam scanning electron m..:

Stopka, Jan ; Zuidema, Wilco ; Kruit, Pieter
Ultramicroscopy. 223 (2021) - p. 113223 , 2021

Link: https://doi.org/10.1016/..

8

High-throughput imaging of biological samples with Delmic's..:

Fermie, Job ; Zuidema, Wilco ; Šejnoha, Radim...
Microscopy and Microanalysis. 27 (2021) S1 - p. 558-560 , 2021

Link: https://doi.org/10.1017/..

9

Quality of vision and vision‐related quality of life after ..:

Dunker, Suryan L. ; Dickman, Mor M. ; Wisse, Robert P.L....
Acta Ophthalmologica. 99 (2021) 7 - p. , 2021

Link: https://doi.org/10.1111/..

10

Cathodes for Electron Microscopy and Lithography:

, In: Modern Developments in Vacuum Electron Sources; Topics in Applied Physics,

Kruit, Pieter - p. 251-292 , 2020

Link: https://doi.org/10.1007/..

11

Local versus Global Optimization of Electron Lens System De..:

, In: 2020 IEEE 6th International Conference on Optimization and Applications (ICOA),

Mahmoudi Nezhad, Neda Hesam ; Niasar, Mohamad Ghaffarian ; Hagen, Cornelis Wouter. - p. 1-6 , 2020

Link: https://doi.org/10.1109/..

12

Combined Focused Electron Beam-Induced Deposition and Etchi..:

Hari, Sangeetha ; Trompenaars, P. H. F. ; Mulders, J. J. L...
Micromachines. 12 (2020) 1 - p. 8 , 2020

Link: https://doi.org/10.3390/..

13

Beam displacement and blur caused by fast electron beam def..:

Zhang, Lixin ; Garming, Mathijs W.H. ; Hoogenboom, Jacob P..
Ultramicroscopy. 211 (2020) - p. 112925 , 2020

Link: https://doi.org/10.1016/..

14

Transmission imaging on a scintillator in a scanning electr..:

Zuidema, Wilco ; Kruit, Pieter
Ultramicroscopy. 218 (2020) - p. 113055 , 2020

Link: https://doi.org/10.1016/..

15

Lock-in Ultrafast Electron Microscopy Simultaneously Visual..:

Garming, Mathijs W. H. ; Bolhuis, Maarten ; Conesa-Boj, Sonia..
The Journal of Physical Chemistry Letters. 11 (2020) 20 - p. 8880-8886 , 2020

Link: https://doi.org/10.1021/..