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Kuball, Martin
343  results:
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1

Temperature-Dependent Thermal Impedance Measurement of GaN-..:

Zheng, Xiang ; Pomeroy, James W. ; Jindal, Gautam.
IEEE Transactions on Electron Devices.  71 (2024)  4 - p. 2367-2372 , 2024
Link: https://doi.org/10.1109/..
 
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2

Nanocrystalline Diamond Lateral Overgrowth for High Thermal..:

Francis, Daniel ; Ji, Xiaoyang ; Vanjari, Sai Charan...
ECS Transactions.  113 (2024)  7 - p. 15-22 , 2024
Link: https://doi.org/10.1149/..
 
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3

Thermal conductivity of SiC and PyC coatings in spherical n..:

Pomeroy, James W. ; Leide, Alex ; Mowat, Miriam...
Journal of the European Ceramic Society.  44 (2024)  6 - p. 3696-3704 , 2024
Link: https://doi.org/10.1016/..
 
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4

Author Correction: Electrical and thermal characterisation ..:

Petkov, Alexander ; Mishra, Abhishek ; Cattelan, Mattia...
Scientific Reports.  14 (2024)  1 - p. , 2024
Link: https://doi.org/10.1038/..
 
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5

$\beta$-Ga2O3 in Power Electronics Converters: Opportunitie..:

Jahdi, Saeed ; Kumar, Akhil S. ; Deakin, Matthew..
IEEE Open Journal of Power Electronics.  5 (2024)  - p. 554-564 , 2024
Link: https://doi.org/10.1109/..
 
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6

Thermodynamics of Ga2O3 Heteroepitaxy and Material Growth V..:

Sanyal, Indraneel ; Nandi, Arpit ; Cherns, David.
ACS Applied Electronic Materials.  6 (2024)  7 - p. 5021-5028 , 2024
Link: https://doi.org/10.1021/..
 
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7

Lossless Phonon Transition Through GaN‐Diamond and Si‐Diamo..:

Malakoutian, Mohamadali ; Woo, Kelly ; Rich, Dennis...
Advanced Electronic Materials.  , 2024
Link: https://doi.org/10.1002/..
 
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8

Analysis of interface trap induced ledge in β-Ga2O3 based M..:

Bhat, Aditya K. ; Kim, Hyun-Seop ; Mishra, Abhishek...
Journal of Applied Physics.  135 (2024)  19 - p. , 2024
Link: https://doi.org/10.1063/..
 
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9

On the reduced damage tolerance of fine-grained nuclear gra..:

Jiang, Ming ; Ell, Jon ; Barnard, Harold...
Carbon.  222 (2024)  - p. 118924 , 2024
Link: https://doi.org/10.1016/..
 
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10

Turn-On Voltage Instability of β-Ga2O3 Trench Schottky Barr..:

Kim, Hyun-Seop ; Bhat, Aditya K. ; Smith, Matthew D..
IEEE Transactions on Electron Devices.  71 (2024)  6 - p. 3609-3613 , 2024
Link: https://doi.org/10.1109/..
 
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11

Optical Mapping of Local Threshold Voltage with micrometer ..:

Anjali, Anjali ; Pomeroy, James W. ; Chen, Jr-Tai.
IEEE Electron Device Letters.  , 2024
Link: https://doi.org/10.1109/..
 
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12

Mapping Electric Fields in Semiconductor Devices: Effect of..:

Cao, Yuke ; Pomeroy, James ; Kuball, Martin
Optics Letters.  , 2024
Link: https://doi.org/10.1364/..
 
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13

Simultaneous Measurement of Thermal Conductivity and Volume..:

Abdallah, Zeina ; Pomeroy, James W. ; Blasakis, Nicolas..
ACS Applied Electronic Materials.  6 (2024)  7 - p. 5183-5189 , 2024
Link: https://doi.org/10.1021/..
 
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14

Dielectric properties of diamond using an X-band microwave ..:

Cuenca, Jerome A. ; Mandal, Soumen ; Stritt, Jaspa...
Carbon.  221 (2024)  - p. 118860 , 2024
Link: https://doi.org/10.1016/..
 
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15

Dielectric Thickness and Fin Width Dependent OFF-State Degr..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Kumar, Akhil S. ; Uren, Michael J. ; Smith, Matthew D.... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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