Kunc, J
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6

Thickness of sublimation grown SiC layers measured by scann..:

Kunc, J. ; Rejhon, M. ; Dědič, V..
Journal of Alloys and Compounds.  789 (2019)  - p. 607-612 , 2019
 
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8

Micro-Raman mapping of surface changes induced by XUV laser..:

Vozda, V. ; Burian, T. ; Chalupský, J....
Journal of Alloys and Compounds.  763 (2018)  - p. 662-669 , 2018
 
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9

The electroluminescent properties based on bias polarity of..:

Rejhon, M ; Franc, J ; Dědič, V..
Journal of Physics D: Applied Physics.  51 (2018)  26 - p. 265104 , 2018
 
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11

Influence of low-temperature annealing on Schottky barrier ..:

Rejhon, M ; Franc, J ; Zázvorka, J..
Semiconductor Science and Technology.  32 (2017)  8 - p. 085007 , 2017
 
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13

Analysis of trapping and de-trapping in CdZnTe detectors by..:

Rejhon, M ; Franc, J ; Dědič, V..
Journal of Physics D: Applied Physics.  49 (2016)  37 - p. 375101 , 2016
 
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14

Hole spin injection from a GaMnAs layer into GaAs–AlAs–InGa..:

Rodrigues, D H ; Brasil, M J S P ; Orlita, M...
Journal of Physics D: Applied Physics.  49 (2016)  16 - p. 165104 , 2016
 
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