Kvit, Alexander V.
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2

Bayesian Statistical Model for Imaging of Single La Vacanci..:

Feng, Jie ; Kvit, Alexander V. ; Zhang, Chenyu..
Microscopy and Microanalysis.  23 (2017)  S1 - p. 1572-1573 , 2017
 
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3

High-precision stress mapping and defect characterization o..:

Kvit, Alexander V. ; Feng, Jie ; Zhang, Chenyu..
Microscopy and Microanalysis.  22 (2016)  S3 - p. 1526-1527 , 2016
 
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4

Three-Dimensional Imaging of Single La Vacancies in LaMnO 3:

Feng, Jie ; Kvit, Alexander V. ; Zhang, Chenyu..
Microscopy and Microanalysis.  22 (2016)  S3 - p. 902-903 , 2016
 
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7

Cl-Doped ZnO Nanowires with Metallic Conductivity and Their..:

Wang, Fei ; Seo, Jung-Hun ; Li, Zhaodong...
ACS Applied Materials & Interfaces.  6 (2014)  2 - p. 1288-1293 , 2014
 
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10

Structure, morphology and chemical composition of sputter d..:

Deepthi, B. ; Barshilia, Harish C. ; Rajam, K.S....
Surface and Coatings Technology.  205 (2010)  2 - p. 565-574 , 2010
 
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