Kwasnick, Robert
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Advanced methods for CPU product reliability modeling and e..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
 
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Telemetry for System Reliability:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Kwasnick, Robert ; Gartler, Hermann ; Boelter, Josh... - p. 13.2.1-13.2.4 , 2019
 
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