E-LIB Suche - Ergebnisse für: Kwon, Hyuk-Min

1

Effects of thermal annealing on analog resistive switching ..:

An, Yeong-Jin ; Yan, Han ; Yeom, Chae-min...
Nanoscale. 16 (2024) 9 - p. 4609-4619 , 2024

Link: https://doi.org/10.1039/..

2

High-performance uniform stepper-based InP double-heterojun..:

Heon Shin, Seung ; Jeong, Hyeon-Seok ; Kim, Yong-Hyun...
Solid-State Electronics. 217 (2024) - p. 108933 , 2024

Link: https://doi.org/10.1016/..

3

Effect of Trap Behavior on the Reliability Instability of M..:

Shin, Ki-Yong ; Shin, Ju-Won ; Amir, Walid...
Materials. 16 (2023) 18 - p. 6138 , 2023

Link: https://doi.org/10.3390/..

4

New Methodology for Parasitic Resistance Extraction and Cap..:

Chakraborty, Surajit ; Amir, Walid ; Kwon, Hyuk-Min.
Electronics. 12 (2023) 14 - p. 3044 , 2023

Link: https://doi.org/10.3390/..

5

Impact of Charge-Trapping Effects on Reliability Instabilit..:

Amir, Walid ; Chakraborty, Surajit ; Kwon, Hyuk-Min.
Materials. 16 (2023) 12 - p. 4469 , 2023

Link: https://doi.org/10.3390/..

6

Explicit Thermal Resistance Model of Self-Heating Effects o..:

Chakraborty, Surajit ; Amir, Walid ; Shin, Ju-Won...
Materials. 15 (2022) 23 - p. 8415 , 2022

Link: https://doi.org/10.3390/..

7

Zinc oxide and indium-gallium-zinc-oxide bi-layer synaptic ..:

Choi, Hyun-Woong ; Song, Ki-Woo ; Kim, Seong-Hyun...
Scientific Reports. 12 (2022) 1 - p. , 2022

Link: https://doi.org/10.1038/..

8

CMOS Platform TEG for Development of High Performance Synap..:

, In: 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS),

An, Yeong-Jin ; Kim, Seong-Hyun ; Song, Ki-Woo... - p. 1-4 , 2022

Link: https://doi.org/10.1109/..

9

Olecranon Fracture Sustained during Arm Wrestling in Middle..:

Lee, Chang-Yk ; Kwon, Hyuk-Min ; Kim, Han-Bit
Journal of the Korean Orthopaedic Association. 57 (2022) 6 - p. 520 , 2022

Link: https://doi.org/10.4055/..

10

Effect of high-pressure D2 and H2 annealing on LFN properti..:

Shin, Hyun-Jin ; Eadi, Sunil Babu ; An, Yeong-Jin...
Scientific Reports. 12 (2022) 1 - p. , 2022

Link: https://doi.org/10.1038/..

11

Instability Assessment of AlGaN/GaN High Electron Mobility ..:

, In: 2022 Asia-Pacific Microwave Conference (APMC),

Amir, Walid ; Shin, Ju-Won ; Chakraborty, Surajit... - p. 184-186 , 2022

Link: https://doi.org/10.23919..

12

On the universality of drain-induced-barrier-lowering in fi..:

, In: 2022 International Electron Devices Meeting (IEDM),

Choi, Su-Min ; Jo, Hyeon-Bhin ; Yun, Do-Young... - p. 8.3.1-8.3.4 , 2022

Link: https://doi.org/10.1109/..

13

On-Chip Nano Pulse Test Element Group for Analysis of Synap..:

, In: 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS),

Ryu, Tae-Gyu ; Kim, Seong-Hyun ; Song, Ki-Woo... - p. 1-3 , 2022

Link: https://doi.org/10.1109/..

14

A Study on Dominant Mechanism and Analytical Model of Low-F..:

Shin, Hyun-Jin ; Eadi, Sunil Babu ; Kim, Seong-Hyun...
IEEE Journal of the Electron Devices Society. 10 (2022) - p. 679-686 , 2022

Link: https://doi.org/10.1109/..

15

Impact of fast and slow transient charging effect on reliab..:

Kwon, Hyuk-Min ; Kim, Dae-Hyun ; Kim, Tae-Woo
Japanese Journal of Applied Physics. 59 (2020) 11 - p. 110903 , 2020

Link: https://doi.org/10.35848..