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Kwon, Soonyang
11
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Online (11)
Mediatypes
Articles (Online) (7)
OpenAccess-fulltext (4)
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1
Microsphere-assisted hyperspectral imaging: super-resolutio..:
Park, Jangryul
;
Choi, Youngsun
;
Kwon, Soonyang
...
Light: Science & Applications. 13 (2024) 1 - p. , 2024
Link:
https://doi.org/10.1038/..
?
2
Snapshot Mueller spectropolarimeter imager:
Dai, Tianxiang
;
Phan, Thaibao
;
Wang, Evan W.
...
Microsystems & Nanoengineering. 9 (2023) 1 - p. , 2023
Link:
https://doi.org/10.1038/..
?
3
Microsphere-assisted, nanospot, non-destructive metrology f..:
Kwon, Soonyang
;
Park, Jangryul
;
Kim, Kwangrak
..
Light: Science & Applications. 11 (2022) 1 - p. , 2022
Link:
https://doi.org/10.1038/..
?
4
Correction of PZT scanner errors using a phase compensation..:
Kim, Namyoon
;
Kwon, Soonyang
Applied Optics. 60 (2021) 30 - p. 9311 , 2021
Link:
https://doi.org/10.1364/..
?
5
Fast Analysis of Film Thickness in Spectroscopic Reflectome..:
Kim, Kwangrak
;
Kwon, Soonyang
;
Pahk, Heui Jae
Current Optics and Photonics. 1 (2017) 1 - p. 29-33 , 2017
Link:
https://doi.org/10.3807/..
?
6
Critical dimension measurement of transparent film layers b..:
Kwon, Soonyang
;
Kim, Namyoon
;
Jo, Taeyong
.
Optics Express. 22 (2014) 14 - p. 17370 , 2014
Link:
https://doi.org/10.1364/..
?
7
Volumetric thin film thickness measurement using spectrosco..:
Kim, Kwangrak
;
Kim, Seongryong
;
Kwon, Soonyang
.
International Journal of Precision Engineering and Manufacturing. 15 (2014) 9 - p. 1817-1822 , 2014
Link:
https://doi.org/10.1007/..
?
8
Snapshot Mueller spectropolarimeter imager:
Dai, Tianxiang
;
Phan, Thaibao
;
Wang, Evan W
...
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC10560212/. , 2023
Link:
http://www.ncbi.nlm.nih...
?
9
Microsphere-assisted, nanospot, non-destructive metrology f..:
Kwon, Soonyang
;
Park, Jangryul
;
Kim, Kwangrak
..
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC8821559/. , 2022
Link:
http://www.ncbi.nlm.nih...
?
10
Snapshot Mueller spectropolarimeter imager:
Tianxiang Dai
;
Thaibao Phan
;
Evan W. Wang
...
https://doi.org/10.1038/s41378-023-00588-y. , 2023
Link:
https://doi.org/10.1038/..
?
11
Microsphere-assisted, nanospot, non-destructive metrology f..:
Soonyang Kwon
;
Jangryul Park
;
Kwangrak Kim
..
https://doi.org/10.1038/s41377-022-00720-z. , 2022
Link:
https://doi.org/10.1038/..
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