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Kwon, Soonyang
11  results:
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1

Microsphere-assisted hyperspectral imaging: super-resolutio..:

Park, Jangryul ; Choi, Youngsun ; Kwon, Soonyang...
Light: Science & Applications.  13 (2024)  1 - p. , 2024
Link: https://doi.org/10.1038/..
 
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2

Snapshot Mueller spectropolarimeter imager:

Dai, Tianxiang ; Phan, Thaibao ; Wang, Evan W....
Microsystems & Nanoengineering.  9 (2023)  1 - p. , 2023
Link: https://doi.org/10.1038/..
 
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3

Microsphere-assisted, nanospot, non-destructive metrology f..:

Kwon, Soonyang ; Park, Jangryul ; Kim, Kwangrak..
Light: Science & Applications.  11 (2022)  1 - p. , 2022
Link: https://doi.org/10.1038/..
 
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4

Correction of PZT scanner errors using a phase compensation..:

Kim, Namyoon ; Kwon, Soonyang
Applied Optics.  60 (2021)  30 - p. 9311 , 2021
Link: https://doi.org/10.1364/..
 
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5

Fast Analysis of Film Thickness in Spectroscopic Reflectome..:

Kim, Kwangrak ; Kwon, Soonyang ; Pahk, Heui Jae
Current Optics and Photonics.  1 (2017)  1 - p. 29-33 , 2017
Link: https://doi.org/10.3807/..
 
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6

Critical dimension measurement of transparent film layers b..:

Kwon, Soonyang ; Kim, Namyoon ; Jo, Taeyong.
Optics Express.  22 (2014)  14 - p. 17370 , 2014
Link: https://doi.org/10.1364/..
 
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7

Volumetric thin film thickness measurement using spectrosco..:

Kim, Kwangrak ; Kim, Seongryong ; Kwon, Soonyang.
International Journal of Precision Engineering and Manufacturing.  15 (2014)  9 - p. 1817-1822 , 2014
Link: https://doi.org/10.1007/..
 
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8

Snapshot Mueller spectropolarimeter imager:

Dai, Tianxiang ; Phan, Thaibao ; Wang, Evan W...
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC10560212/.  , 2023
Link: http://www.ncbi.nlm.nih...
 
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9

Microsphere-assisted, nanospot, non-destructive metrology f..:

Kwon, Soonyang ; Park, Jangryul ; Kim, Kwangrak..
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC8821559/.  , 2022
Link: http://www.ncbi.nlm.nih...
 
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10

Snapshot Mueller spectropolarimeter imager:

Tianxiang Dai ; Thaibao Phan ; Evan W. Wang...
https://doi.org/10.1038/s41378-023-00588-y.  , 2023
Link: https://doi.org/10.1038/..
 
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11

Microsphere-assisted, nanospot, non-destructive metrology f..:

Soonyang Kwon ; Jangryul Park ; Kwangrak Kim..
https://doi.org/10.1038/s41377-022-00720-z.  , 2022
Link: https://doi.org/10.1038/..
 
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