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2023 IEEE International Integrated Reliability Workshop (IIRW) ,
2
Electrically active defects in Al2O3-InGaAs MOS stacks at c..:
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2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) ,
4
Modeling Degradation and Breakdown in SiO2 and High-k Gate ..:
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2023 IEEE International Reliability Physics Symposium (IRPS) ,
6
Towards a Universal Model of Dielectric Breakdown:
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2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ,
9
Screen-Printed Flexible Circular and Rectangular Silver Spi..:
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2019 IEEE 19th International Conference on Nanotechnology (IEEE-NANO) ,
12