E-LIB Suche - Ergebnisse für: Lachenal, D.

1

Alleviating performance and cost constraints in silicon het..:

, In: 2019 IEEE 46th Photovoltaic Specialists Conference (PVSC),

Batzner, D. L. ; Cardoso, J. P. ; Aeby, C.... - p. 1471-1474 , 2019

Link: https://doi.org/10.1109/..

2

Optimization of tunnel-junction IBC solar cells based on a ..:

Lachenal, D. ; Papet, P. ; Legradic, B....
Solar Energy Materials and Solar Cells. 200 (2019) - p. 110036 , 2019

Link: https://doi.org/10.1016/..

3

Shadow masking and tunnel contacts: A low cost process for ..:

, In: 2019 IEEE 46th Photovoltaic Specialists Conference (PVSC),

Legradic, B. ; Aeby, C. ; Frammelsberger, W.... - p. 2546-2549 , 2019

Link: https://doi.org/10.1109/..

4

Interdigitated back contact silicon heterojunction solar ce..:

Paviet-Salomon, B. ; Tomasi, A. ; Lachenal, D....
Solar Energy. 175 (2018) - p. 60-67 , 2018

Link: https://doi.org/10.1016/..

5

New Cell Metallization Patterns for Heterojunction Solar Ce..:

Papet, P. ; Andreetta, L. ; Lachenal, D....
Energy Procedia. 67 (2015) - p. 203-209 , 2015

Link: https://doi.org/10.1016/..

6

Improved amorphous/crystalline silicon interface passivatio..:

Descoeudres, A. ; Barraud, L. ; De Wolf, Stefaan...
Applied Physics Letters. 99 (2011) 12 - p. , 2011

Link: https://doi.org/10.1063/..

7

Properties of high efficiency silicon heterojunction cells:

Bätzner, D.L. ; Andrault, Y. ; Andreetta, L....
Energy Procedia. 8 (2011) - p. 153-159 , 2011

Link: https://doi.org/10.1016/..

8

Degradation mechanism understanding of NLDEMOS SOI in RF ap..:

Lachenal, D. ; Bravaix, A. ; Monsieur, F..
Microelectronics Reliability. 47 (2007) 9-11 - p. 1634-1638 , 2007

Link: https://doi.org/10.1016/..

9

HCI degradation model based on the diffusion equation inclu..:

Lachenal, D. ; Monsieur, F. ; Rey-Tauriac, Y..
Microelectronic Engineering. 84 (2007) 9-10 - p. 1921-1924 , 2007

Link: https://doi.org/10.1016/..

10

Hot-carrier reliability of 20V MOS transistors in 0.13 μm C..:

Rey-Tauriac, Y. ; Badoc, J. ; Reynard, B....
Microelectronics Reliability. 45 (2005) 9-11 - p. 1349-1354 , 2005

Link: https://doi.org/10.1016/..

11

Application of ESR Spectroscopy in Bleaching Studies:

Cardona-Barrau, D. ; Matéo, C. ; Lachenal, D..
Holzforschung. 57 (2003) 2 - p. 171-180 , 2003

Link: https://doi.org/10.1515/..

12

Eucalyptus globulus Kraft Pulp Residual Lignin. Part 2. Mod..:

Duarte, A.P. ; Robert, D. ; Lachenal, D.
Holzforschung. 55 (2001) 6 - p. 645-651 , 2001

Link: https://doi.org/10.1515/..

13

19F NMR Spectroscopy for the Quantitative Analysis of Carbo..:

Sevillano, R.M. ; Mortha, G. ; Barrelle, M..
Holzforschung. 55 (2001) 3 - p. 286-295 , 2001

Link: https://doi.org/10.1515/..

14

Formation of Radical Species During ClO2Delignmcation:

Joncourt, M. J. ; Froment, P. ; Lachenal, D.
Journal of Wood Chemistry and Technology. 18 (1998) 2 - p. 159-170 , 1998

Link: https://doi.org/10.1080/..

15

Discoloration of α-Carbonyl-Free Lignin Model Compounds Und..:

Castellan, A. ; Colombo, N. ; Nourmamode, A....
Journal of Wood Chemistry and Technology. 10 (1990) 4 - p. 461-493 , 1990

Link: https://doi.org/10.1080/..