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Lakhdhar, H.
2
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Online (2)
Mediatypes
Articles (Online) (1)
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1
Reliability assessment of ultra-short gate length AlGaN/GaN..:
Lakhdhar, H.
;
Labat, N.
;
Curutchet, A.
...
Microelectronics Reliability. 64 (2016) - p. 594-598 , 2016
Link:
https://doi.org/10.1016/..
?
2
Abstracts of 1st International Conference on Computational ..:
Bouamra, Faiza
;
Roberto Dovesi
;
Fabien Pascale
...
https://books.aijr.org/index.php/press/catalog/book/122. , 2022
Link:
https://books.aijr.org/i..
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