Lancin, M
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2

Cavities at the Si projected range by high dose and energy ..:

Canino, M. ; Regula, G. ; Lancin, M....
Materials Science and Engineering: B.  159-160 (2009)  - p. 153-156 , 2009
 
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Defects created in N-doped 4H-SiC in the brittle regime: St..:

Lancin, M. ; Texier, M. ; Regula, G..
Philosophical Magazine.  89 (2009)  15 - p. 1251-1266 , 2009
 
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Structural Characterization of Nanocrystalline Silicon Laye..:

, In: Springer Proceedings in Physics; Microscopy of Semiconducting Materials 2007,
Texier, M ; Acciarri, M ; Binetti, S... - p. 305-308 , 2008
 
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Nanocrystalline silicon films as multifunctional material f..:

Pizzini, S. ; Acciarri, M. ; Binetti, S....
Materials Science and Engineering: B.  134 (2006)  2-3 - p. 118-124 , 2006
 
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Nitrogen doping and multiplicity of stacking faults in SiC:

Pirouz, P. ; Zhang, M. ; Hobgood, H. McD....
Philosophical Magazine.  86 (2006)  29-31 - p. 4685-4697 , 2006
 
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LACBED study of extended defects in 4H-SiC:

Texier, M. ; Regula, G. ; Lancin, M..
Philosophical Magazine Letters.  86 (2006)  9 - p. 529-537 , 2006
 
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Structural characterization of double stacking faults induc..:

Regula *, G. ; Lancin, M. ; Idrissi, H...
Philosophical Magazine Letters.  85 (2005)  5 - p. 259-267 , 2005
 
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Structural characterization of 6H- and 4H-SiC polytypes by ..:

Ottaviani, L ; Hidalgo, P ; Idrissi, H...
Journal of Physics: Condensed Matter.  16 (2003)  2 - p. S107-S114 , 2003
 
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Influence of synthesis method on the microstructure of Sr3−..:

Caldes, M.T ; Goglio, G ; Marhic, C...
International Journal of Inorganic Materials.  3 (2001)  8 - p. 1169-1171 , 2001
 
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15

Gettering of Diffused Au and of Cu and Ni Contamination in ..:

El Bouayadi, R. ; Regula, G. ; Pichaud, B....
physica status solidi (b).  222 (2000)  1 - p. 319-326 , 2000
 
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