I agree that this site is using cookies. You can find further informations
here
.
X
Login
My folder (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
Show Desktop-Version
Toggle navigation
Lancin, M
~ 0
results:
Search for persons
X
Format
Online
Mediatypes
Articles (Online)
Bookchapter (Online)
OpenAccess-fulltext
Languages
english (39)
french (4)
Sorted by: Relevance
Sorted by: Year
?
1
Roles of local He concentration and Si sample orientation o..:
Canino, Mariaconcetta
;
Regula, Gabrielle
;
Xu, Ming
...
Philosophical Magazine. 91 (2011) 34 - p. 4324-4331 , 2011
Link:
https://doi.org/10.1080/..
?
2
Cavities at the Si projected range by high dose and energy ..:
Canino, M.
;
Regula, G.
;
Lancin, M.
...
Materials Science and Engineering: B. 159-160 (2009) - p. 153-156 , 2009
Link:
https://doi.org/10.1016/..
?
3
Defects created in N-doped 4H-SiC in the brittle regime: St..:
Lancin, M.
;
Texier, M.
;
Regula, G.
.
Philosophical Magazine. 89 (2009) 15 - p. 1251-1266 , 2009
Link:
https://doi.org/10.1080/..
?
4
Structural Characterization of Nanocrystalline Silicon Laye..:
, In:
Springer Proceedings in Physics; Microscopy of Semiconducting Materials 2007
,
Texier, M
;
Acciarri, M
;
Binetti, S
... - p. 305-308 , 2008
Link:
https://doi.org/10.1007/..
?
5
30° Si(g) partial dislocation mobility in nitrogen-doped 4H..:
Idrissi, H.
;
Pichaud, B.
;
Regula, G.
.
Journal of Applied Physics. 101 (2007) 11 - p. , 2007
Link:
https://doi.org/10.1063/..
?
6
Nanocrystalline silicon films as multifunctional material f..:
Pizzini, S.
;
Acciarri, M.
;
Binetti, S.
...
Materials Science and Engineering: B. 134 (2006) 2-3 - p. 118-124 , 2006
Link:
https://doi.org/10.1016/..
?
7
Nitrogen doping and multiplicity of stacking faults in SiC:
Pirouz, P.
;
Zhang, M.
;
Hobgood, H. McD.
...
Philosophical Magazine. 86 (2006) 29-31 - p. 4685-4697 , 2006
Link:
https://doi.org/10.1080/..
?
8
LACBED study of extended defects in 4H-SiC:
Texier, M.
;
Regula, G.
;
Lancin, M.
.
Philosophical Magazine Letters. 86 (2006) 9 - p. 529-537 , 2006
Link:
https://doi.org/10.1080/..
?
9
Influence of metal trapping on the shape of cavities induce..:
El Bouayadi, R.
;
Regula, G.
;
Lancin, M.
..
Journal of Applied Physics. 99 (2006) 4 - p. , 2006
Link:
https://doi.org/10.1063/..
?
10
Structural characterization of double stacking faults induc..:
Regula *, G.
;
Lancin, M.
;
Idrissi, H.
..
Philosophical Magazine Letters. 85 (2005) 5 - p. 259-267 , 2005
Link:
https://doi.org/10.1080/..
?
11
Structural characterization of 6H- and 4H-SiC polytypes by ..:
Ottaviani, L
;
Hidalgo, P
;
Idrissi, H
...
Journal of Physics: Condensed Matter. 16 (2003) 2 - p. S107-S114 , 2003
Link:
https://doi.org/10.1088/..
?
12
Structural characterization of Fe(110) islands grown on α-A..:
Quintana, C
;
Menéndez, J.L
;
Huttel, Y
...
Thin Solid Films. 434 (2003) 1-2 - p. 228-238 , 2003
Link:
https://doi.org/10.1016/..
?
13
Influence of synthesis method on the microstructure of Sr3−..:
Caldes, M.T
;
Goglio, G
;
Marhic, C
...
International Journal of Inorganic Materials. 3 (2001) 8 - p. 1169-1171 , 2001
Link:
https://doi.org/10.1016/..
?
14
Analysis of Ti–Si–N diffusion barrier films obtained by r.f..:
Le Brizoual, L
;
Guilet, S
;
Lempérière, G
...
Microelectronic Engineering. 50 (2000) 1-4 - p. 509-513 , 2000
Link:
https://doi.org/10.1016/..
?
15
Gettering of Diffused Au and of Cu and Ni Contamination in ..:
El Bouayadi, R.
;
Regula, G.
;
Pichaud, B.
...
physica status solidi (b). 222 (2000) 1 - p. 319-326 , 2000
Link:
https://doi.org/10.1002/..
1-15