Landheer, D.
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2

Composition Modulation in High-k Hafnium Silicate Films:

Wu, X ; Liu, J ; Lennard, WN.
Microscopy and Microanalysis.  16 (2010)  S2 - p. 1904-1905 , 2010
 
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10

Oxidation of III–V semiconductors:

Graham, M.J. ; Moisa, S. ; Sproule, G.I....
Corrosion Science.  49 (2007)  1 - p. 31-41 , 2007
 
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11

Composition and Growth of Thermal and Anodic Oxides on InAl:

, In: Passivation of Metals and Semiconductors, and Properties of Thin Oxide Layers,
Kleber, S. ; Graham, M.J. ; Moisa, S.... - p. 263-270 , 2006
 
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15

Spatially-resolved EELS and EDS Analysis of HfOxNy Gate Die..:

Wu, X ; Couillard, M. ; Lee, M.-S....
Microscopy and Microanalysis.  10 (2004)  S02 - p. 606-607 , 2004
 
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