E-LIB Suche - Ergebnisse für: Lee, Geon-Beom

1

A Novel Charge Pumping Technique With Gate-Induced Drain Le..:

Lee, Geon-Beom ; Kim, Jeong-Yeon ; Choi, Yang-Kyu
IEEE Electron Device Letters. 44 (2023) 5 - p. 709-712 , 2023

Link: https://doi.org/10.1109/..

2

Reliability Improvement of Gate-All-Around SONOS Memory by ..:

Lee, Jung-Woo ; Han, Joon-Kyu ; Yu, Ji-Man...
IEEE Transactions on Electron Devices. 69 (2022) 1 - p. 115-119 , 2022

Link: https://doi.org/10.1109/..

3

A Steep-Slope Phenomenon by Gate Charge Pumping in a MOSFET:

Kim, Myung-Su ; Yun, Gyeong-Jun ; Kim, Wu-Kang...
IEEE Electron Device Letters. 43 (2022) 4 - p. 521-524 , 2022

Link: https://doi.org/10.1109/..

4

Curing of 1-Transistor-DRAM by Joule Heat From Punch-Throug..:

Kim, Hyun-Jung ; Lee, Geon-Beom ; Han, Joon-Kyu...
IEEE Electron Device Letters. 43 (2022) 3 - p. 370-373 , 2022

Link: https://doi.org/10.1109/..

5

Mnemonic-opto-synaptic transistor for in-sensor vision syst..:

Han, Joon-Kyu ; Chung, Young-Woo ; Sim, Jaeho...
Scientific Reports. 12 (2022) 1 - p. , 2022

Link: https://doi.org/10.1038/..

6

Synaptic Segmented Transistor with Improved Linearity by Sc..:

Kim, Seong-Yeon ; Yu, Ji-Man ; Lee, Gi Sung...
ACS Applied Materials & Interfaces. 14 (2022) 28 - p. 32261-32269 , 2022

Link: https://doi.org/10.1021/..

7

Concealable Oscillation-Based Physical Unclonable Function ..:

Jung, Jin-Woo ; Han, Joon-Kyu ; Yu, Ji-Man...
IEEE Electron Device Letters. 43 (2022) 8 - p. 1359-1362 , 2022

Link: https://doi.org/10.1109/..

8

Multi-functional logic circuits composed of ultra-thin elec..:

Yu, Ji-Man ; Lee, Chungryeol ; Han, Joon-Kyu...
Journal of Materials Chemistry C. 9 (2021) 22 - p. 7222-7227 , 2021

Link: https://doi.org/10.1039/..

9

Gateless and Capacitorless Germanium Biristor with a Vertic..:

Bae, Hagyoul ; Lee, Geon-Beom ; Hur, Jae...
Micromachines. 12 (2021) 8 - p. 899 , 2021

Link: https://doi.org/10.3390/..

10

Ternary logic decoder using independently controlled double..:

Han, Seong-Joo ; Han, Joon-Kyu ; Kim, Myung-Su...
Scientific Reports. 11 (2021) 1 - p. , 2021

Link: https://doi.org/10.1038/..

11

Lateral profiling of gate dielectric damage by off-state st..:

Lee, Geon-Beom ; Kim, Choong-Ki ; Bang, Tewook..
Microelectronics Reliability. 127 (2021) - p. 114383 , 2021

Link: https://doi.org/10.1016/..

12

High-Performance Field-Effect Transistor and Logic Gates Ba..:

Shin, Gwang Hyuk ; Lee, Geon-Beom ; An, Eun-Su...
ACS Applied Materials & Interfaces. 12 (2020) 4 - p. 5106-5112 , 2020

Link: https://doi.org/10.1021/..

13

Analysis of damage curing in a MOSFET with joule heat gener..:

Lee, Geon-Beom ; Kim, Choong-Ki ; Bang, Tewook...
Microelectronics Reliability. 104 (2020) - p. 113548 , 2020

Link: https://doi.org/10.1016/..

14

A Comparative Study of the Curing Effects of Local and Glob..:

Park, Jun-Young ; Lee, Geon-Beom ; Choi, Yang-Kyu
IEEE Journal of the Electron Devices Society. 7 (2019) - p. 954-958 , 2019

Link: https://doi.org/10.1109/..

15

Si–MoS2 Vertical Heterojunction for a Photodetector with Hi..:

Shin, Gwang Hyuk ; Park, Junghoon ; Lee, Khang June...
ACS Applied Materials & Interfaces. 11 (2019) 7 - p. 7626-7634 , 2019

Link: https://doi.org/10.1021/..