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Lee, Khwang-Sun
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1

Low-frequency noise characterization of positive bias stres..:

Bae, Hagyoul ; Lee, Geon Bum ; Yoo, Jaewook...
Solid-State Electronics.  215 (2024)  - p. 108882 , 2024
Link: https://doi.org/10.1016/..
 
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2

Trench Gate Nanosheet FET to Suppress Leakage Current From ..:

Lee, Khwang-Sun ; Yang, Byung-Do ; Park, Jun-Young
IEEE Transactions on Electron Devices.  70 (2023)  4 - p. 2042-2046 , 2023
Link: https://doi.org/10.1109/..
 
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3

Impact of device-to-device interference in nanosheet field-..:

Lee, Khwang-Sun ; Shin, Woo Cheol ; Yeon, Ju-Won.
Microelectronics Reliability.  145 (2023)  - p. 114995 , 2023
Link: https://doi.org/10.1016/..
 
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4

Comprehensive Study on Trap-Induced Bias Instability via Hi..:

Ku, Ja-Yun ; Lee, Khwang-Sun ; Jung, Dae-Han...
IEEE Transactions on Device and Materials Reliability.  23 (2023)  2 - p. 276-280 , 2023
Link: https://doi.org/10.1109/..
 
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5

Low-Temperature Deuterium Annealing for the Recovery of Ion..:

Wang, Dong-Hyun ; Yoon, Sung-Su ; Ku, Ja-Yun...
IEEE Transactions on Device and Materials Reliability.  23 (2023)  2 - p. 297-301 , 2023
Link: https://doi.org/10.1109/..
 
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6

N-Type Nanosheet FETs without Ground Plane Region for Proce..:

Lee, Khwang-Sun ; Park, Jun-Young
Micromachines.  13 (2022)  3 - p. 432 , 2022
Link: https://doi.org/10.3390/..
 
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7

Vacuum Inner Spacer to Improve Annealing Effect during Elec..:

Wang, Dong-Hyun ; Lee, Khwang-Sun ; Park, Jun-Young
Micromachines.  13 (2022)  7 - p. 987 , 2022
Link: https://doi.org/10.3390/..
 
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8

Improvement of Device Reliability and Variability Using Hig..:

Jung, Dae-Han ; Yoon, Sung-Su ; Ku, Ja-Yun...
Transactions on Electrical and Electronic Materials.  24 (2022)  1 - p. 1-4 , 2022
Link: https://doi.org/10.1007/..
 
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9

High Pressure Deuterium Annealing for Improved Immunity Aga..:

Jung, Dae-Han ; Shin, Woo Cheol ; Kim, Min-Kyeong...
IEEE Transactions on Device and Materials Reliability.  22 (2022)  3 - p. 457-461 , 2022
Link: https://doi.org/10.1109/..
 
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10

Impact of Iterative Deuterium Annealing in Long-Channel MOS..:

Wang, Dong-Hyun ; Ku, Ja-Yun ; Jung, Dae-Han...
Materials.  15 (2022)  5 - p. 1960 , 2022
Link: https://doi.org/10.3390/..
 
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11

Inner Spacer Engineering to Improve Mechanical Stability in..:

Lee, Khwang-Sun ; Park, Jun-Young
Electronics.  10 (2021)  12 - p. 1395 , 2021
Link: https://doi.org/10.3390/..
 
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12

Current annealing to improve drain output performance of β-..:

Bae, Hagyoul ; Lee, Khwang-Sun ; Ye, Peide D..
Solid-State Electronics.  185 (2021)  - p. 108134 , 2021
Link: https://doi.org/10.1016/..
 
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13

Vacuum Inner Spacer to Improve Annealing Effect during Elec..:

Wang, Dong-Hyun ; Lee, Khwang-Sun ; Park, Jun-Young
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC9320427/.  , 2022
Link: http://www.ncbi.nlm.nih...
 
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14

Impact of Iterative Deuterium Annealing in Long-Channel MOS..:

Wang, Dong-Hyun ; Ku, Ja-Yun ; Jung, Dae-Han...
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC8912009/.  , 2022
Link: http://www.ncbi.nlm.nih...
 
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15

Vacuum Inner Spacer to Improve Annealing Effect during Elec..:

Dong-Hyun Wang ; Khwang-Sun Lee ; Jun-Young Park
https://www.mdpi.com/2072-666X/13/7/987.  , 2022
Link: https://doi.org/10.3390/..
 
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