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Lee, Min-Hung
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1

Low Polarization Loss of Long Endurance on Scavenged Ru-Bas..:

Senapati, Asim ; Lou, Zhao-Feng ; Lee, Jia-Yang...
IEEE Electron Device Letters.  45 (2024)  4 - p. 673-676 , 2024
Link: https://doi.org/10.1109/..
 
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2

Ferroelectric transistors based on shear-transformation-med..:

Yang, Tilo H. ; Liang, Bor-Wei ; Hu, Hsiang-Chi...
Nature Electronics.  7 (2023)  1 - p. 29-38 , 2023
Link: https://doi.org/10.1038/..
 
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3

Impact of Si-Based Interfacial Layer for Ferroelectric Memo..:

, In: 2023 Silicon Nanoelectronics Workshop (SNW),
Maikap, Siddheswar ; Senapati, Asim ; Lou, Zhao-Feng. - p. 57-58 , 2023
Link: https://doi.org/10.23919..
 
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4

The Advantages of Double Catalytic Layers for Carbon Nanotu..:

Lin, Hong-Yi ; Basu, Nilabh ; Lee, Min-Hung..
Coatings.  13 (2023)  5 - p. 965 , 2023
Link: https://doi.org/10.3390/..
 
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5

Performance Evaluation of AFeRAM under Low Temperature Oper..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Chen, Yi-Chuan ; Chen, Yu-Chen ; Hsiang, Kuo-Yu.. - p. 1-3 , 2023
Link: https://doi.org/10.1109/..
 
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6

Ferroelectric Engineering of FeFET Toward Multi-Level Codin..:

, In: 2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT),
Lee, Min-Hung - p. 1-1 , 2023
Link: https://doi.org/10.1109/..
 
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7

NLS based Modeling of Temperature-dependent Phase Transitio..:

, In: 2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT),
Chen, Yu-Chen ; Hsiang, Kuo-Yu ; Lee, Min-Hung. - p. 1-2 , 2023
Link: https://doi.org/10.1109/..
 
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8

Multi-Layer Chips on Wafer Stacking Technologies with Carbo..:

, In: 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC),
Liao, Bo-Zhou ; Chen, Liang-Hsi ; Chen, Kai-Cheng... - p. 1811-1817 , 2022
Link: https://doi.org/10.1109/..
 
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9

Mechanisms of instability retention for ferroelectric field..:

Liao, Chun-Yu ; Lin, Chen-Ying ; Lee, Zhi-Xian...
Applied Physics Letters.  121 (2022)  25 - p. , 2022
Link: https://doi.org/10.1063/..
 
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10

Monte-Carlo Modeling and Characterization of Switching Dyna..:

, In: 2022 International Electron Devices Meeting (IEDM),
Chen, Yu-Chen ; Hsiang, Kuo-Yu ; Lee, Min-Hung. - p. 13.4.1-13.4.4 , 2022
Link: https://doi.org/10.1109/..
 
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11

Improving Edge Dead Domain and Endurance in Scaled HfZrOx F..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Lin, Yu-De ; Yeh, Po-Chun ; Tang, Ying-Tsan... - p. 6.4.1-6.4.4 , 2021
Link: https://doi.org/10.1109/..
 
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12

Visualizing Ferroelectric Uniformity of Hf1–xZrxO2 Films Us..:

Chang, Shu-Jui ; Teng, Chih-Yu ; Lin, Yi-Jan...
ACS Applied Materials & Interfaces.  13 (2021)  24 - p. 29212-29221 , 2021
Link: https://doi.org/10.1021/..
 
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13

Unipolar Parity of Ferroelectric-Antiferroelectric Characte..:

Hsiang, Kuo-Yu ; Liao, Chun-Yu ; Wang, Jer-Fu...
Nanomaterials.  11 (2021)  10 - p. 2685 , 2021
Link: https://doi.org/10.3390/..
 
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14

NLS based Modeling and Characterization of Switching Dynami..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Chen, Yu-Chen ; Hsiang, Kuo-Yu ; Tang, Ying-Tsan.. - p. 15.4.1-15.4.4 , 2021
Link: https://doi.org/10.1109/..
 
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15

Ferroelectric HfZrO₂ FETs for Emerging Technologies:

, In: 2020 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA),
Lee, Min-Hung - p. 148-148 , 2020
Link: https://doi.org/10.1109/..
 
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