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2024 IEEE International Reliability Physics Symposium (IRPS) ,
1
Effect of Off-State Stress on Data-Valid Window Margin for ..:
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2024 IEEE International Reliability Physics Symposium (IRPS) ,
2
Thermo-Mechanical Reliability Characteristics of 8H HBM3:
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2024 IEEE International Reliability Physics Symposium (IRPS) ,
3
Virtual FA Methodology for DRAM: Real-Time Analysis and Ris..:
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2023 IEEE International Reliability Physics Symposium (IRPS) ,
4
Reliability Characterization of HBM featuring $\text{HK}+\t..:
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2023 IEEE International Reliability Physics Symposium (IRPS) ,
6
Reliability Improvement with Optimized BEOL Process in Adva..:
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2023 IEEE International Reliability Physics Symposium (IRPS) ,
7
Development and Product Reliability Characterization of Adv..:
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2022 IEEE International Reliability Physics Symposium (IRPS) ,
10
Transistor Reliability Characterization for Advanced DRAM w..:
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2021 IEEE International Electron Devices Meeting (IEDM) ,
12