E-LIB Suche - Ergebnisse für: Lee, Ya-Huan

1

Impact of deposition temperature on electrical properties o..:

Yeh, Yu-Hsuan ; Tan, Yung-Fang ; Huang, Yen-Che...
Journal of Applied Physics. 135 (2024) 6 - p. , 2024

2

Analysis of Abnormal C–V Hump on Si3N4 MIS-HEMT With Mesa I..:

Lee, Ya-Huan ; Chang, Kai-Chun ; Lin, Hsin-Ni...
IEEE Transactions on Electron Devices. 71 (2024) 4 - p. 2349-2354 , 2024

Link: https://doi.org/10.1109/..

3

The Transition of Threshold Voltage Shift of Al2O3/Si3N4 Al..:

Lee, Ya-Huan ; Chang, Kai-Chun ; Tai, Mao-Chou...
IEEE Transactions on Electron Devices. 71 (2024) 3 - p. 1792-1797 , 2024

Link: https://doi.org/10.1109/..

4

Reliability Enhancement by Doping Boron and Fluorine in Lig..:

Yeh, Chien-Hung ; Chang, Ting-Chang ; Kuo, Ting-Tzu...
IEEE Electron Device Letters. 44 (2023) 6 - p. 971-974 , 2023

Link: https://doi.org/10.1109/..

5

Investigation of Threshold Voltage and Drain Current Degrad..:

Kuo, Hung-Ming ; Chang, Ting-Chang ; Chang, Kai-Chun...
IEEE Transactions on Electron Devices. 70 (2023) 5 - p. 2216-2221 , 2023

Link: https://doi.org/10.1109/..

6

Degradation mechanism differences between TiN- and TaN-elec..:

Yeh, Yu-Hsuan ; Chen, Wen-Chung ; Chang, Ting-Chang...
Semiconductor Science and Technology. 38 (2023) 8 - p. 085004 , 2023

Link: https://doi.org/10.1088/..

7

Abnormal on Current Tendency in Saturation Region Between H..:

Yeh, Chien-Hung ; Chen, Po-Hsun ; Chang, Ting-Chang...
IEEE Electron Device Letters. 44 (2023) 7 - p. 1164-1167 , 2023

Link: https://doi.org/10.1109/..

8

Defect Passivation and Reliability Enhancement by Low-Tempe..:

Hung, Wei-Chieh ; Hung, Wei-Chun ; Chang, Ting-Chang...
IEEE Electron Device Letters. 44 (2023) 5 - p. 789-792 , 2023

Link: https://doi.org/10.1109/..

9

Analysis of Hump Effect Induced by Positive Bias Temperatur..:

Hung, Wei-Chieh ; Jin, Fu-Yuan ; Chang, Ting-Chang...
IEEE Transactions on Device and Materials Reliability. 23 (2023) 2 - p. 263-268 , 2023

Link: https://doi.org/10.1109/..

10

Impact of Variant Gate Insulator Fabrication Process on Rel..:

Chien, Ya-Ting ; Zhou, Kuan-Ju ; Tai, Mao-Chou...
IEEE Transactions on Electron Devices. 70 (2023) 3 - p. 1089-1094 , 2023

Link: https://doi.org/10.1109/..

11

Effects of X-ray accelerating voltage on electrical propert..:

Lin, Hsin-Ni ; Chang, Ting-Chang ; Chen, Wen-Chung...
Applied Physics Express. 15 (2022) 3 - p. 034002 , 2022

Link: https://doi.org/10.35848..

12

Investigation of the Self-Heating Effect in High Performanc..:

Chen, Yu-An ; Zheng, Yu-Zhe ; Chang, Ting-Chang...
IEEE Electron Device Letters. 43 (2022) 8 - p. 1243-1246 , 2022

Link: https://doi.org/10.1109/..

13

Effect of deposition temperature on electrical properties o..:

Lin, Yun-Hsuan ; Chen, Wen-Chung ; Chen, Po-Hsun...
Applied Physics Letters. 117 (2020) 2 - p. , 2020

Link: https://doi.org/10.1063/..

14

Synthesis and Characterization of Low-Melting-Point Polyami..:

Chen, Yu-Hao ; Huang, Ya-Ting ; Lee, Yi-Huan.
Industrial & Engineering Chemistry Research. 60 (2021) 47 - p. 17072-17082 , 2021

Link: https://doi.org/10.1021/..

15

Traffic-related air pollution associated with chronic kidne..:

Chen, Szu-Ying ; Chu, Da-Chen ; Lee, Jui-Huan..
Environmental Pollution. 234 (2018) - p. 838-845 , 2018

Link: https://doi.org/10.1016/..