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Lee, Yi-Shiun
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1

Design and Implementation of an Access Control System by Us..:

, In: 2022 IEEE International Conference on Consumer Electronics - Taiwan,
Huang, Shih-Yung ; Lee, Yi-Shiun ; Fanjiang, Yong-Yi... - p. 227-228 , 2022
Link: https://doi.org/10.1109/..
 
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2

Design and Implement the Convenient Home Appliances Control..:

, In: 2020 IEEE 9th Global Conference on Consumer Electronics (GCCE),
Lee, Yi-Shiun ; Fanjiang, Yong-Yi ; Hung, Chi-Huang.. - p. 604-605 , 2020
Link: https://doi.org/10.1109/..
 
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3

Design and Implementation of Capacity Control Display Syste..:

, In: 2019 IEEE International Conference on Consumer Electronics - Taiwan (ICCE-TW),
Huang, Hsin-Yu ; Fanjiang, Yong-Yi ; Hung, Chi-Huang. - p. 1-2 , 2019
Link: https://doi.org/10.1109/..
 
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4

A Meals Ordering System by Using Augmented Reality Technolo..:

, In: 2019 IEEE International Conference on Consumer Electronics - Taiwan (ICCE-TW),
Lee, Yi-Shiun ; Fanjiang, Yong-Yi ; Hung, Chi-Huang. - p. 1-2 , 2019
Link: https://doi.org/10.1109/..
 
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5

Carbonyl compounds in dining areas, kitchens and exhaust st..:

Cheng, Jen-Hsuan ; Lee, Yi-Shiun ; Chen, Kang-Shin
Journal of Environmental Sciences.  41 (2016)  - p. 218-226 , 2016
Link: https://doi.org/10.1016/..
 
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6

Wafer Defect Pattern Classification with Explainable-Decisi..:

, In: 2022 IEEE International Test Conference (ITC),
Cheng, Ken Chau-Cheung ; Li, Katherine Shu-Min ; Wang, Sying-Jyan... - p. 549-553 , 2022
Link: https://doi.org/10.1109/..
 
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7

TestDNA-E: Wafer Defect Signature for Pattern Recognition b..:

Li, Katherine Shu-Min ; Chen, Leon Li-Yang ; Cheng, Ken Chau-Cheung...
IEEE Transactions on Semiconductor Manufacturing.  35 (2022)  2 - p. 372-374 , 2022
Link: https://doi.org/10.1109/..
 
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8

Wafer Scratch Pattern Reconstruction for High Diagnosis Acc..:

Li, Katherine Shu-Min ; Chen, Leon Li-Yang ; Liao, Peter Yi-Yu...
IEEE Transactions on Semiconductor Manufacturing.  35 (2022)  2 - p. 272-281 , 2022
Link: https://doi.org/10.1109/..
 
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9

Wafer-level test path pattern recognition and test characte..:

, In: Proceedings of the 23rd Conference on Design, Automation and Test in Europe,
Cheng, Ken Chau-Cheung ; Li, Katherine Shu-Min ; Huang, Andrew Yi-Ann... - p. 1710-1711 , 2020
Link: https://dl.acm.org/doi/1..
 
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10

TestDNA: Novel Wafer Defect Signature for Diagnosis and Pat..:

Li, Katherine Shu-Min ; Tsai, Nova Cheng-Yen ; Cheng, Ken Chau-Cheung...
IEEE Transactions on Semiconductor Manufacturing.  33 (2020)  3 - p. 383-390 , 2020
Link: https://doi.org/10.1109/..
 
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11

TestDNA-E: Wafer Defect Signature for Pattern Recognition b..:

, In: 2020 IEEE International Test Conference (ITC),
Chen, Leon Li-Yang ; Li, Katherine Shu-Min ; Cheng, Ken Chau-Cheung... - p. 1-4 , 2020
Link: https://doi.org/10.1109/..
 
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12

Wafer-Level Test Path Pattern Recognition and Test Characte..:

, In: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE),
Cheng, Ken Chau-Cheung ; Shu-Min Li, Katherine ; Huang, Andrew Yi-Ann... - p. 1710-1711 , 2020
Link: https://doi.org/10.23919..
 
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13

TestDNA: Novel Wafer Defect Signature for Diagnosis and Yie..:

, In: 2019 IEEE International Test Conference (ITC),
Huang, Andrew Yi-Ann ; Li, Katherine Shu-Min ; Tsai, Cheng-Yen... - p. 1-6 , 2019
Link: https://doi.org/10.1109/..
 
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14

DNN Regression Model and Microphone Array for Noise Reducti..:

, In: 2018 International Conference on Orange Technologies (ICOT),
Lee, Sheng-Chieh ; Chen, Che-Wen ; Su, Bo-Hao... - p. 1 - 4 , 2018
Link: https://doi.org/10.1109/..
 
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15

Exploring Student Motivation in Integration of Soft Skills ..:

, In: Proceedings of the 55th ACM Technical Symposium on Computer Science Education V. 1,
Lee, En-Shiun Annie ; Danukarjanto, Luki ; Sharmin, Sadia... - p. 708-714 , 2024
Link: https://dl.acm.org/doi/1..
 
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