E-LIB Suche - Ergebnisse für: Lee, Yong Bin

1

Understanding phase evolution of ferroelectric Hf0.5Zr0.5O2..:

Shin, Jonghoon ; Seo, Haengha ; Ye, Kun Hee...
Journal of Materials Chemistry C. 12 (2024) 14 - p. 5035-5046 , 2024

Link: https://doi.org/10.1039/..

2

Impact of operation voltage and NH3 annealing on the fatigu..:

Kim, Kyung Do ; Lee, Yong Bin ; Lee, Suk Hyun...
Nanoscale. 15 (2023) 40 - p. 16390-16402 , 2023

Link: https://doi.org/10.1039/..

3

Exploring the Physical Origin of the Negative Capacitance E..:

Park, Hyeon Woo ; Byun, Seungyong ; Kim, Kyung Do...
Advanced Functional Materials. 33 (2023) 51 - p. , 2023

Link: https://doi.org/10.1002/..

4

Atomic layer deposition of HfNx films and improving the fil..:

Ryoo, Seung Kyu ; Kim, Beom Yong ; Lee, Yong Bin...
Journal of Materials Chemistry C. 11 (2023) 24 - p. 8018-8026 , 2023

Link: https://doi.org/10.1039/..

5

Top Electrode Engineering for High‐Performance Ferroelectri..:

Kim, Beom Yong ; Lee, In Soo ; Park, Hyeon Woo...
Advanced Materials Technologies. 8 (2023) 16 - p. , 2023

Link: https://doi.org/10.1002/..

6

Influences of the inhomogeneity of the ferroelectric thin f..:

Do Kim, Kyung ; Lee, Yong Bin ; Lee, Suk Hyun...
MRS Communications. 13 (2023) 5 - p. 825-833 , 2023

Link: https://doi.org/10.1557/..

7

Evolution of the Ferroelectric Properties of AlScN Film by ..:

Kim, Kyung Do ; Lee, Yong Bin ; Lee, Suk Hyun...
Advanced Electronic Materials. 9 (2023) 5 - p. , 2023

Link: https://doi.org/10.1002/..

8

Top Electrode Engineering for High‐Performance Ferroelectri..:

Kim, Beom Yong ; Lee, In Soo ; Park, Hyeon Woo...
Advanced Materials Technologies. 8 (2023) 16 - p. , 2023

Link: https://doi.org/10.1002/..

9

Oxygen‐Scavenging Effects of Added Ti Layer in the TiN Gate..:

Lee, Yong Bin ; Kim, Beom Yong ; Park, Hyeon Woo...
Advanced Electronic Materials. 8 (2022) 11 - p. 2270056 , 2022

Link: https://doi.org/10.1002/..

10

Double S‐Shaped Polarization – Voltage Curve and Negative C..:

Park, Hyeon Woo ; Oh, Minsik ; Lee, In Soo...
Advanced Functional Materials. 33 (2022) 9 - p. , 2022

Link: https://doi.org/10.1002/..

11

Oxygen‐Scavenging Effects of Added Ti Layer in the TiN Gate..:

Lee, Yong Bin ; Kim, Beom Yong ; Park, Hyeon Woo...
Advanced Electronic Materials. 8 (2022) 11 - p. 2200310 , 2022

Link: https://doi.org/10.1002/..

12

Investigation of Optimum Deposition Conditions of Radio Fre..:

Ryoo, Seung Kyu ; Kim, Kyung Do ; Park, Hyeon Woo...
Advanced Electronic Materials. 8 (2022) 11 - p. 2200726 , 2022

Link: https://doi.org/10.1002/..

13

Improved ferroelectricity in Hf0.5Zr0.5O2 by inserting an u..:

Kim, Beom Yong ; Kim, Se Hyun ; Park, Hyeon Woo...
Applied Physics Letters. 119 (2021) 12 - p. , 2021

Link: https://doi.org/10.1063/..

14

Enhanced Ferroelectric Properties in Hf0.5Zr0.5O2 Films Usi..:

Kim, Beom Yong ; Park, Hyeon Woo ; Hyun, Seung Dam...
Advanced Electronic Materials. 8 (2021) 6 - p. , 2021

Link: https://doi.org/10.1002/..

15

Polarizing and depolarizing charge injection through a thin..:

Park, Hyeon Woo ; Hyun, Seung Dam ; Lee, In Soo...
Nanoscale. 13 (2021) 4 - p. 2556-2572 , 2021

Link: https://doi.org/10.1039/..