I agree that this site is using cookies. You can find further informations here.
X
Legon, Andria
1  results:
Search for persons X
?
1

Detection and Classification of PCB Defects using Deep Lear..:

, In: 2022 IEEE 31st Microelectronics Design & Test Symposium (MDTS),
Legon, Andria ; Deo, Makarand ; Albin, Sacharia. - p. 1-6 , 2022
Link: https://doi.org/10.1109/..
 
1-1