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Leveugle, Régis
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1

Choose your Path: Control of Ring Oscillators EMFI Suscepti..:

, In: 2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS),
El Amraoui, Sami ; Leveugle, Regis ; Maistri, Paolo - p. 118-123 , 2024
Link: https://doi.org/10.1109/..
 
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2

Secured Bus as a Countermeasure against Covert Channels: NE..:

, In: 2024 IEEE 25th Latin American Test Symposium (LATS),
Leveugle, Regis ; Hocquette, Nathan ; Labarre, Charles... - p. 1-2 , 2024
Link: https://doi.org/10.1109/..
 
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3

Hardware Acceleration and Approximation of CNN Computations..:

Leveugle, Régis ; Cogney, Arthur ; Gah El Hilal, Ahmed Baba..
Electronics.  13 (2024)  14 - p. 2709 , 2024
Link: https://doi.org/10.3390/..
 
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4

Harmonic Response of Ring Oscillators under Single ElectroM..:

, In: 2024 IEEE 25th Latin American Test Symposium (LATS),
Amraoui, Sami El ; Douadi, Aghiles ; Leveugle, Regis. - p. 1-6 , 2024
Link: https://doi.org/10.1109/..
 
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5

Understanding the Link Between Complex Digital Devices Soft..:

Noizette, Luc ; Miller, Florent ; Colladant, Thierry..
IEEE Transactions on Nuclear Science.  70 (2023)  8 - p. 1747-1754 , 2023
Link: https://doi.org/10.1109/..
 
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6

Recovering Information on the CVA6 RISC-V CPU with a Bareme..:

, In: 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS),
Martinoli, Valentin ; Teglia, Yannick ; Abdellah, Bouagoun. - p. 1-6 , 2022
Link: https://doi.org/10.1109/..
 
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7

FMEA on Critical Systems: A Cross-Layer Approach Based on H..:

, In: VLSI-SoC: Technology Advancement on SoC Design; IFIP Advances in Information and Communication Technology,
Roux, Julie ; Morin-Allory, Katell ; Beroulle, Vincent... - p. 113-133 , 2022
Link: https://doi.org/10.1007/..
 
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8

CCALK: (When) CVA6 Cache Associativity Leaks the Key:

Martinoli, Valentin ; Tourneur, Elouan ; Teglia, Yannick.
Journal of Low Power Electronics and Applications.  13 (2022)  1 - p. 1 , 2022
Link: https://doi.org/10.3390/..
 
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9

High-level fault injection to assess FMEA on critical syste..:

Roux, Julie ; Beroulle, Vincent ; Morin-Allory, Katell...
Microelectronics Reliability.  122 (2021)  - p. 114135 , 2021
Link: https://doi.org/10.1016/..
 
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10

High Level Fault Injection Method for Evaluating Critical S..:

, In: 2020 27th IEEE International Conference on Electronics, Circuits and Systems (ICECS),
Roux, Julie ; Beroulle, Vincent ; Morin-Allory, Katell... - p. 1-4 , 2020
Link: https://doi.org/10.1109/..
 
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11

Dynamic Authentication-Based Secure Access to Test Infrastr..:

, In: 2020 IEEE European Test Symposium (ETS),
Portolan, Michele ; Reynaud, Vincent ; Maistri, Paolo. - p. 1-6 , 2020
Link: https://doi.org/10.1109/..
 
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12

Cross Layer Fault Simulations for Analyzing the Robustness ..:

, In: 2020 23rd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS),
Roux, Julie ; Beroulle, Vincent ; Morin-Allory, Katell... - p. 1-4 , 2020
Link: https://doi.org/10.1109/..
 
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13

Hardware Support for Security in the Internet of Things: Fr..:

Leveugle, Régis ; Mkhinini, Asma ; Maistri, Paolo
Information.  9 (2018)  5 - p. 114 , 2018
Link: https://doi.org/10.3390/..
 
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14

Analysis of laser-induced errors: RTL fault models versus l..:

Papadimitriou, Athanasios ; Hély, David ; Beroulle, Vincent..
Microprocessors and Microsystems.  47 (2016)  - p. 64-73 , 2016
Link: https://doi.org/10.1016/..
 
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15

Tutorial 1: "New approaches towards early dependability eva..:

, In: 2016 11th International Design & Test Symposium (IDT),
Leveugle, Regis - p. xv-xv , 2016
Link: https://doi.org/10.1109/..
 
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