Levit, D.
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3

Exploring Charge Trapping Dynamics in Si:HfO₂-FeFETs by Tem..:

, In: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
 
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Trigger Timing Interface for the Read-Out Upgrade of the Be..:

Levit, D. ; Bessner, M. ; Biswas, D....
IEEE Transactions on Nuclear Science.  70 (2023)  6 - p. 941-948 , 2023
 
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Commissioning and Operation of the Upgraded Belle II DAQ Sy..:

Lai, Y.-T. ; Bessner, M. ; Biswas, D....
IEEE Transactions on Nuclear Science.  70 (2023)  6 - p. 890-897 , 2023
 
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Firmware Development of the PCI-express-based High-Speed Re..:

, In: 2021 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC),
Lai, Y.-T. ; Bessner, M. ; Biswas, D.... - p. 1-3 , 2021
 
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