Li, Xiaomian
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2

A review of image-based insulator defect detection algorith..:

, In: 2024 5th International Conference on Computer Vision, Image and Deep Learning (CVIDL),
Li, Xiaomian ; Blancaflor, Eric B. - p. 718-724 , 2024
 
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4

Grand Challenges in Printed Circuit Board Defect Detection ..:

, In: Proceedings of the 2023 8th International Conference on Big Data and Computing,
 
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Research on glass surface quality inspection based on machi..:

Li, Xiaomian ; Shu, Yufeng
Australian Journal of Mechanical Engineering.  16 (2018)  sup1 - p. 98-104 , 2018
 
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