Li, Ze-Hong
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3

Enhanced Filed Limiting Rings for Improving Breakdown Volta..:

, In: 2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT),
Zhao, Yi-Shang ; Li, Ze-Hong ; Xia, Zi-Ming... - p. 1-3 , 2022
 
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4

Experimental Investigation on Displacement Damage Effects o..:

Li, Lei ; Chen, Xiao-Chi ; Liu, Xu-Qiang...
IEEE Transactions on Nuclear Science.  69 (2022)  9 - p. 2065-2073 , 2022
 
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5

A Novel Use of the Shielded Gate in SGT MOSFETs as the Volt..:

, In: 2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT),
Yang, Yang ; Li, Ze-Hong ; Zhao, Yi-Shang... - p. 1-3 , 2022
 
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6

4H-SiC Trench MOSFET with Integrated Heterojunction Diode f..:

, In: 2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT),
Zhou, Chun-Ying ; Ren, Min ; Li, Xi... - p. 1-3 , 2022
 
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7

Ionization Radiation-Induced Base Current Decreasing and Na..:

Li, Lei ; Chen, Xiao-Chi ; Xiong, Cen...
IEEE Transactions on Nuclear Science.  69 (2022)  7 - p. 1733-1746 , 2022
 
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8

Displacement Damage Effects of Pulse Discharge Circuit Swit..:

Li, Lei ; Chen, Xiao-Chi ; Zeng, Guang...
IEEE Transactions on Nuclear Science.  69 (2022)  3 - p. 609-619 , 2022
 
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9

A Study on Ionization Damage Effects of Anode-Short MOS-Con..:

Li, Lei ; Li, Ze-hong ; Chen, Xiao-Chi...
IEEE Transactions on Nuclear Science.  67 (2020)  9 - p. 2062-2072 , 2020
 
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10

High Performance Termination of Power Devices with Multi-ep..:

, In: 2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT),
Liu, Yu-Zhen ; Li, Ze-Hong ; Yu, Tao... - p. 1-3 , 2020
 
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11

Ionization Damage Effects of Pulse Discharge Circuit Switch..:

Li, Lei ; Li, Ze-Hong ; Zhang, Jin-Ping...
IEEE Journal of the Electron Devices Society.  8 (2020)  - p. 1096-1104 , 2020
 
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12

An Adaptive Gate Current Modulator based on Fuzzy PID for V..:

, In: 2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT),
Wan, Jia-Li ; Li, Ze-Hong ; Zeng, Xiao... - p. 1-3 , 2020
 
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13

Improved Model for Ionization-Induced Surface Recombination..:

Li, Lei ; Chen, Xiao-Chi ; Jian, Yuan...
IEEE Transactions on Nuclear Science.  67 (2020)  8 - p. 1826-1834 , 2020
 
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14

The Superjunction Device with Optimized Process Window of B..:

, In: 2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT),
Ren, Min ; Li, Lv-Qiang ; Lan, Yaoyao... - p. 1-3 , 2020
 
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