Lien, Chenhsin
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2

Stably Saturated Output Current Characteristics and Hot-Car..:

Tu, Yu-Fa ; Huang, Jen-Wei ; Chang, Ting-Chang...
IEEE Transactions on Electron Devices.  70 (2023)  9 - p. 4669-4673 , 2023
 
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3

Analysis of Critical Schottky Distance Effect and Distribut..:

, In: 2023 35th International Conference on Microelectronic Test Structure (ICMTS),
 
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4

Improving Performance of FBARs by Advanced Low-Temperature ..:

, In: 2023 35th International Conference on Microelectronic Test Structure (ICMTS),
Tu, Yu-Fa ; Chang, Ting-Chang ; Zhou, Kuan-Ju... - p. 1-4 , 2023
 
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5

Abnormal Two-Stage Degradation Under Hot Carrier Injection ..:

Hung, Wei-Chun ; Tu, Yu-Fa ; Chang, Ting-Chang...
IEEE Transactions on Electron Devices.  70 (2023)  7 - p. 3419-3423 , 2023
 
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6

Asymmetric Electrode Structure Induces Dual-Channel Phenome..:

Tu, Yu-Fa ; Huang, Jen-Wei ; Chang, Ting-Chang...
IEEE Electron Device Letters.  44 (2023)  9 - p. 1496-1499 , 2023
 
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7

Diffused Beam Energy to Dope van der Waals Electronics and ..:

Lin, Che-Yi ; Lee, Mu-Pai ; Chang, Yuan-Ming...
ACS Applied Materials & Interfaces.  14 (2022)  36 - p. 41156-41164 , 2022
 
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10

Device operation and physical mechanism of asymmetric junct..:

Chen, Yu-Hsuan ; Teng, Hung-Jin ; Lien, Chen-Hsin.
Semiconductor Science and Technology.  37 (2022)  6 - p. 065007 , 2022
 
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12

Improving Reliability of a-InGaZnO TFTs With Optimal Locati..:

Tu, Yu-Fa ; Chiang, Cheng-Ling ; Chang, Ting-Chang...
IEEE Transactions on Electron Devices.  69 (2022)  6 - p. 3181-3185 , 2022
 
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