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2024 IEEE International Reliability Physics Symposium (IRPS) ,
5
A Comprehensive Study of Read-After-Write-Delay for Ferroel..:
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2024 IEEE International Reliability Physics Symposium (IRPS) ,
7
Drain Current Degradation Induced by Charge Trapping/De-Tra..:
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2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ,
8
Ferroelectric Gate Stack Engineering with Tunnel Dielectric..:
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2024 IEEE International Memory Workshop (IMW) ,
9
Design Framework for Ferroelectric Gate Stack Engineering o..:
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2023 International Electron Devices Meeting (IEDM) ,
12
In-Situ Encrypted NAND FeFET Array for Secure Storage and C..:
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2023 International Electron Devices Meeting (IEDM) ,
13
Comprehensive Design Guidelines of Gate Stack for QLC and H..:
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2023 International Electron Devices Meeting (IEDM) ,
14