Lin, Gong-Kai
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1

The Transition Behavior of Power LDNMOS at the ON–OFF Trans..:

Lee, Jian-Hsing ; Liao, Chih-Cherng ; Lin, Gong-Kai...
IEEE Transactions on Electron Devices.  71 (2024)  7 - p. 4247-4252 , 2024
 
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2

Bipolar Transistors' Holding Phenomena:

, In: 2023 International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan),
Huang, Shao-Chang ; Hsu, Kai-Chieh ; Lin, Chih-Hsuan... - p. 221-222 , 2023
 
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3

Transmission Line Pulse Width Impacting on Device Performan..:

, In: 2023 International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan),
 
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4

A Concise Electrothermal Model to Characterize the Thermal ..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
 
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5

Optimizing Device Metal Routing Layouts by the Simulation T..:

, In: 2023 International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan),
Huang, Shao-Chang ; Li, Ching-Ho ; Liao, Chih-Cherng... - p. 219-220 , 2023
 
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6

Gate Voltages Impacting on Latch-up Measurements:

, In: 2022 IEEE International Conference on Consumer Electronics - Taiwan,
 
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7

EOS Endurance Power Circuits without Depletion Mode Devices:

, In: 2022 IEEE International Conference on Consumer Electronics - Taiwan,
 
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8

Large array device characteristics improvements:

Huang, Shao-Chang ; Li, Ching-Ho ; Liao, Chih-Cherng...
Microelectronics Reliability.  125 (2021)  - p. 114353 , 2021
 
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9

The Correlations between ESD and TLP in Large Array Devices:

, In: 2020 IEEE International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan),
 
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10

Signal Control Switching for Improving Large Array Devices'..:

, In: 2020 IEEE International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan),
 
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11

Improving the operational characteristic stability in Al/Au..:

Wu, Cheng-Yen ; You, Hsin-Chiang ; Lin, Gong-Kai.
Japanese Journal of Applied Physics.  55 (2016)  4 - p. 044101 , 2016
 
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