Lin, Jeng-Da
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1

Impact of Source/Drain Tie on a 30 nm Bottom Gate MOSFETs:

, In: 2007 IEEE Conference on Electron Devices and Solid-State Circuits,
Lin, Jyi-Tsong ; Lin, Jeng-Da ; Shiang-Shi, Kang... - p. None , 2007
 
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7

Long-Range Corrected Hybrid Density Functionals with Improv..:

Lin, You-Sheng ; Li, Guan-De ; Mao, Shan-Ping.
Journal of Chemical Theory and Computation.  9 (2012)  1 - p. 263-272 , 2012
 
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8

Assessment of density functional approximations for the hem..:

Pan, Piin-Ruey ; Lin, You-Sheng ; Tsai, Ming-Kang..
Physical Chemistry Chemical Physics.  14 (2012)  30 - p. 10705 , 2012
 
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9

Effect of Impurity Distribution on Corrosion Behavior of El..:

Lin, Jeng-Yu ; Wan, Chi-Chao ; Wang, Yung-Yun...
Journal of The Electrochemical Society.  154 (2007)  6 - p. H530 , 2007
 
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10

Discussion on the Cause of Print-through Phenomenon of FRP ..:

Lin, Huei-Jeng ; Lai, Wei-Ming ; Huang, Hou-Da.
Journal of Composite Materials.  44 (2010)  17 - p. 2111-2126 , 2010
 
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12

Rotor time-constant estimation approaches based on energy f..:

Wai, Rong-Jong ; Liu, Da-Chung ; Lin, Faa-Jeng
Electric Power Systems Research.  52 (1999)  3 - p. 229-239 , 1999
 
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13

A comparative study of sliding mode and model reference ada..:

Lin, Faa-Jeng ; Wai, Rong-Jong ; Kuo, Ren-Hao.
Electric Power Systems Research.  44 (1998)  3 - p. 163-174 , 1998
 
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