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2024 IEEE 42nd VLSI Test Symposium (VTS) ,
1
WaferCap: Open Classification of Wafer Map Patterns using D..:
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Proceedings of the 8th ACM/IEEE International Conference on Connected Health: Applications, Systems and Engineering Technologies ,
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DOVE: Shoulder-based Opioid Overdose Detection and Reversal..:
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2023 IEEE/ACM Conference on Connected Health: Applications, Systems and Engineering Technologies (CHASE) ,
3