Litrico, G.
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1

Nuclear fragment identification with ΔE-E telescopes exploi..:

Ciampi, C. ; Pasquali, G. ; Altana, C....
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment.  925 (2019)  - p. 60-69 , 2019
 
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2

Time resolved X-ray emission diagnostics in an axis-symmetr..:

Castro, G. ; Muoio, A. ; Mascali, D....
Journal of Instrumentation.  14 (2019)  10 - p. C10035-C10035 , 2019
 
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Integration of heat production and thermal comfort models i..:

Aluisio, B. ; Dicorato, M. ; Forte, G...
Sustainable Energy, Grids and Networks.  16 (2018)  - p. 37-54 , 2018
 
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4

From thin film to bulk 3C-SiC growth: Understanding the mec..:

La Via, F. ; Severino, A. ; Anzalone, R....
Materials Science in Semiconductor Processing.  78 (2018)  - p. 57-68 , 2018
 
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5

Silicon Carbide detectors for nuclear physics experiments a..:

Litrico, G ; Tudisco, S ; La Via, F...
Journal of Physics: Conference Series.  1056 (2018)  - p. 012032 , 2018
 
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Growing bulk-like 3C-SiC from seeding material produced by ..:

Schuh, P. ; Arzig, M. ; Litrico, G....
physica status solidi (a).  214 (2017)  4 - p. 1600429 , 2017
 
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Sublimation growth of bulk 3C-SiC using 3C-SiC-on-Si (1 0 0..:

Schuh, P. ; Schöler, M. ; Wilhelm, M....
Journal of Crystal Growth.  478 (2017)  - p. 159-162 , 2017
 
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11

3C-SiC bulk sublimation growth on CVD hetero-epitaxial seed..:

, In: 2016 European Conference on Silicon Carbide & Related Materials (ECSCRM),
Schuh, P. ; Litrico, G. ; La Via, F... - p. 1-1 , 2016
 
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13

Progress in SiC-4H Epitaxy with Horizontal Hot Wall Reactor:

Mauceri, M. ; Pecora, A. ; Litrico, G....
ECS Journal of Solid State Science and Technology.  2 (2013)  8 - p. N3051-N3054 , 2013
 
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14

Defects annealing in 4H–SiC epitaxial layer probed by low t..:

Litrico, G. ; Zimbone, M. ; Musumeci, P..
Materials Science in Semiconductor Processing.  15 (2012)  6 - p. 740-743 , 2012
 
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15

Ion track effect on point defect production in SiC:

Litrico, G. ; Zimbone, M. ; Musumeci, P...
Radiation Effects and Defects in Solids.  166 (2011)  7 - p. 480-486 , 2011
 
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