E-LIB Suche - Ergebnisse für: Liu, Chuan-Hsi

1

Inhibited Degradation of Organic–Inorganic Perovskite-Based..:

Huang, Pao-Hsun ; Lai, Pin-Jia ; Chen, Wen-Ray...
Crystals. 13 (2023) 3 - p. 452 , 2023

Link: https://doi.org/10.3390/..

2

The Mechanism of PEDOT: PSS Films with Organic Additives:

Lien, Shui-Yang ; Lin, Po-Chen ; Chen, Wen-Ray...
Crystals. 12 (2022) 8 - p. 1109 , 2022

Link: https://doi.org/10.3390/..

3

The Annealing Effect at Different Temperatures for Organic-..:

Lien, Shui-Yang ; Lai, Pin-Jia ; Chen, Wen-Ray...
Crystals. 12 (2022) 2 - p. 204 , 2022

Link: https://doi.org/10.3390/..

4

Crystalline Phase Segregation of Quantum-Dots-Passivated CH..:

Huang, Pao-Hsun ; Liu, Shao-Yu ; Liu, Chuan-Hsi..
Crystals. 12 (2022) 11 - p. 1556 , 2022

Link: https://doi.org/10.3390/..

5

Improving Optoelectrical Properties of PEDOT: PSS by Organi..:

Lien, Shui-Yang ; Lin, Po-Chen ; Chen, Wen-Ray...
Crystals. 12 (2022) 4 - p. 537 , 2022

Link: https://doi.org/10.3390/..

6

The Influence of Argon Plasma on Organic Perovskite MAPbI3 ..:

Lien, Shui-Yang ; Liu, Shao-Yu ; Chen, Wen-Ray...
Crystals. 12 (2022) 6 - p. 799 , 2022

Link: https://doi.org/10.3390/..

7

The Influence of Oxygen Plasma on Methylammonium Lead Iodid..:

Lien, Shui-Yang ; Wang, Chi-Wei ; Chen, Wen-Ray...
Molecules. 26 (2021) 17 - p. 5133 , 2021

Link: https://doi.org/10.3390/..

8

Effect of Growth Temperature on the Characteristics of CsPb..:

Lien, Shui-Yang ; Chen, Yu-Hao ; Chen, Wen-Ray..
Molecules. 26 (2021) 15 - p. 4439 , 2021

Link: https://doi.org/10.3390/..

9

Editorial: IEDMS 2016:

Liu, Chuan-Hsi ; Cheng, Chun-Hu ; Cheng, Chin-Pao.
Microelectronics Reliability. 83 (2018) - p. 207 , 2018

Link: https://doi.org/10.1016/..

10

Wide Bandgap Materials for Semiconductor Devices:

Lee, Kuan-Wei ; Liu, Chuan-Hsi ; Misra, Durga
Microelectronics Reliability. 91 (2018) - p. 306 , 2018

Link: https://doi.org/10.1016/..

11

Effect of contact-etch-stop-layer and Si 1-x Ge x channel m..:

Lee, Chang-Chun ; Liu, Chuan-Hsi ; Li, Dian-Yong.
Microelectronics Reliability. 83 (2018) - p. 230-234 , 2018

Link: https://doi.org/10.1016/..

12

Interaction influence of S/D GeSi lattice mismatch and stre..:

Lee, Chang-Chun ; Kuo, Yen-Ting ; Liu, Chuan-Hsi
Materials Science in Semiconductor Processing. 70 (2017) - p. 254-259 , 2017

Link: https://doi.org/10.1016/..

13

Heat stress exposing performance of deep-nano HK/MG nMOSFET..:

Wang, Shea-Jue ; Wang, Mu-Chun ; Chen, Shuang-Yuan...
Microelectronics Reliability. 55 (2015) 11 - p. 2203-2207 , 2015

Link: https://doi.org/10.1016/..

14

Simulation-based sensitivity estimation of the geometric ef..:

Lee, Chang-Chun ; Liu, Chuan-Hsi ; Teng, Hsiao-Hsuan
Thin Solid Films. 570 (2014) - p. 336-342 , 2014

Link: https://doi.org/10.1016/..

15

Mechanical property effects of Si1−xGex channel and stresse..:

Lee, Chang-Chun ; Cheng, Hsien-Chie ; Hsu, Hung-Wen...
Thin Solid Films. 557 (2014) - p. 316-322 , 2014

Link: https://doi.org/10.1016/..