E-LIB Suche - Ergebnisse für: Liu, Xianhe

1

A Study of Flexible BEOL Design Rules Allowing Degreed Slan..:

, In: 2024 Conference of Science and Technology for Integrated Circuits (CSTIC),

Ren, Zhiwei ; Liu, Xianhe ; Li, Yanli.. - p. 1-4 , 2024

Link: https://doi.org/10.1109/..

2

High χ P2PFBEMA-b-P2VP Block Copolymers Forming 6–8 nm Doma..:

Wang, Mengge ; Xue, Tao ; Miao, Han...
ACS Applied Materials & Interfaces. 16 (2024) 24 - p. 31586-31596 , 2024

Link: https://doi.org/10.1021/..

3

A Study on Cross-Level Interconnection of Metal Layers Unde..:

, In: 2024 Conference of Science and Technology for Integrated Circuits (CSTIC),

Li, Ying ; Li, Yanli ; Liu, Xianhe. - p. 1-3 , 2024

Link: https://doi.org/10.1109/..

4

Electrocatalytic nitrogen reduction to ammonia at low overp..:

Gao, Ya ; Zhu, Meng-Jiao ; Liu, Xian-He...
Chemical Engineering Journal. 493 (2024) - p. 152659 , 2024

Link: https://doi.org/10.1016/..

5

A Study of the Via Pattern Lithography Process Window Under..:

, In: 2024 Conference of Science and Technology for Integrated Circuits (CSTIC),

Zhu, Jinhao ; Liu, Xianhe ; Wang, Qi... - p. 1-3 , 2024

Link: https://doi.org/10.1109/..

6

An Optical Critical Dimension (OCD) Study with Standard Str..:

, In: 2023 International Workshop on Advanced Patterning Solutions (IWAPS),

Wang, Qi ; Liu, Xianhe ; Wu, Qiang. - p. 1-4 , 2023

Link: https://doi.org/10.1109/..

7

Illumination Optimization for the Beol Dtco with 45 Degree ..:

, In: 2023 China Semiconductor Technology International Conference (CSTIC),

Liu, Xianhe ; Han, Muzi ; Li, Yanli.. - p. 1-3 , 2023

Link: https://doi.org/10.1109/..

8

Improved BEOL Design Rules With 45-Degree Local Interconnec..:

, In: 2023 IEEE 15th International Conference on ASIC (ASICON),

Liu, Xianhe ; Wu, Qiang ; Li, Yanli. - p. 1-4 , 2023

Link: https://doi.org/10.1109/..

9

A Further Analysis of the Forbidden Pitch in Photolithograp..:

, In: 2023 IEEE 15th International Conference on ASIC (ASICON),

Li, Yanli ; Liu, Xianhe ; Wang, Qi. - p. 1-4 , 2023

Link: https://doi.org/10.1109/..

10

The Analysis of Optical Critical Dimension (OCD) Signal Str..:

, In: 2023 China Semiconductor Technology International Conference (CSTIC),

Wang, Qi ; Wu, Qiang ; Liu, Xianhe. - p. 1-3 , 2023

Link: https://doi.org/10.1109/..

11

The Possibility of Using 193 NM Immersion Lithography Proce..:

, In: 2023 China Semiconductor Technology International Conference (CSTIC),

Wu, Qiang ; Li, Yanli ; Liu, Xianhe. - p. 1-4 , 2023

Link: https://doi.org/10.1109/..

12

Pressure Prediction Model in Transition Ladle based on Adap..:

Liu, Xianhe ; Tian, Jianyan ; Li, Bo.
Journal of Physics: Conference Series. 2170 (2022) 1 - p. 012009 , 2022

Link: https://doi.org/10.1088/..

13

N-polar InGaN nanowires: breaking the efficiency bottleneck..:

Liu, Xianhe ; Sun, Yi ; Malhotra, Yakshita...
Photonics Research. 10 (2022) 2 - p. 587 , 2022

Link: https://doi.org/10.1364/..

14

III-Nitride Nanostructures: Emerging Applications for Micro..:

Wu, Yuanpeng ; Liu, Xianhe ; Pandey, Ayush...
Progress in Quantum Electronics. , 2022

Link: https://doi.org/10.1016/..

15

Process Window, and Process Optimization in Both Low and Hi..:

, In: 2022 China Semiconductor Technology International Conference (CSTIC),

Li, Yanli ; Wu, Qiang ; Liu, Xianhe.. - p. 1-6 , 2022

Link: https://doi.org/10.1109/..