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Lo Nigro, R.
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1

Improvement of Ti/Al/Ti Ohmic contacts on AlGaN/GaN heteros..:

Greco, G. ; Di Franco, S. ; Lo Nigro, R....
Applied Physics Letters.  124 (2024)  1 - p. , 2024
Link: https://doi.org/10.1063/..
 
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2

Direct atomic layer deposition of ultra-thin Al2O3 and HfO2..:

Schilirò, E. ; Panasci, S.E. ; Mio, A.M....
Applied Surface Science.  630 (2023)  - p. 157476 , 2023
Link: https://doi.org/10.1016/..
 
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3

Aluminum Frenkel defects cause hysteresis in Al2O3/AlGaN ca..:

Deretzis, I. ; Fiorenza, P. ; Fazio, T....
Journal of Applied Physics.  132 (2022)  16 - p. , 2022
Link: https://doi.org/10.1063/..
 
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4

Aluminum oxide nucleation in the early stages of atomic lay..:

Schilirò, E. ; Lo Nigro, R. ; Panasci, S.E....
Carbon.  169 (2020)  - p. 172-181 , 2020
Link: https://doi.org/10.1016/..
 
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5

Ohmic contacts on n-type and p-type cubic silicon carbide (..:

Spera, M. ; Greco, G. ; Lo Nigro, R....
Materials Science in Semiconductor Processing.  93 (2019)  - p. 295-298 , 2019
Link: https://doi.org/10.1016/..
 
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6

Electrical and structural properties of surfaces and interf..:

Vivona, M. ; Greco, G. ; Bongiorno, C....
Applied Surface Science.  420 (2017)  - p. 331-335 , 2017
Link: https://doi.org/10.1016/..
 
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7

Ti/Al-based contacts to p-type SiC and GaN for power device..:

Roccaforte, F. ; Vivona, M. ; Greco, G....
physica status solidi (a).  214 (2016)  4 - p. 1600357 , 2016
Link: https://doi.org/10.1002/..
 
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8

Effect of SiO2 interlayer on the properties of Al2O3 thin f..:

Schilirò, E. ; Fiorenza, P. ; Di Franco, S....
physica status solidi (a).  214 (2016)  4 - p. 1600365 , 2016
Link: https://doi.org/10.1002/..
 
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9

Ti/Al/W Ohmic contacts to p-type implanted 4H-SiC:

Vivona, M. ; Greco, G. ; Lo Nigro, R...
Journal of Applied Physics.  118 (2015)  3 - p. , 2015
Link: https://doi.org/10.1063/..
 
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10

Thermal stability of the current transport mechanisms in Ni..:

Vivona, M ; Greco, G ; Giannazzo, F...
Semiconductor Science and Technology.  29 (2014)  7 - p. 075018 , 2014
Link: https://doi.org/10.1088/..
 
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11

Recent advances on dielectrics technology for SiC and GaN p..:

Roccaforte, F. ; Fiorenza, P. ; Greco, G....
Applied Surface Science.  301 (2014)  - p. 9-18 , 2014
Link: https://doi.org/10.1016/..
 
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12

Nanoscale structural and electrical evolution of Ta- and Ti..:

Greco, G. ; Giannazzo, F. ; Iucolano, F...
Journal of Applied Physics.  114 (2013)  8 - p. , 2013
Link: https://doi.org/10.1063/..
 
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13

High permittivity cerium oxide thin films on AlGaN/GaN hete..:

Fiorenza, P. ; Greco, G. ; Fisichella, G....
Applied Physics Letters.  103 (2013)  11 - p. , 2013
Link: https://doi.org/10.1063/..
 
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14

Effects of Different Post-Implantation Annealing Conditions..:

Frazzetto, Alessia ; Roccaforte, Fabrizio ; Giannazzo, Filippo...
Materials Science Forum.  717-720 (2012)  - p. 825-828 , 2012
Link: https://doi.org/10.4028/..
 
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15

Evolution of Structural and Electrical Properties of Au/Ni ..:

Greco, Giuseppe ; Roccaforte, Fabrizio ; Lo Nigro, R....
Materials Science Forum.  717-720 (2012)  - p. 1295-1298 , 2012
Link: https://doi.org/10.4028/..
 
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