Lobre, C.
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1

Modulation Transfer Function Measurements by Electron-Beam-..:

Bustillos Vasco, Samantha ; Baier, N. ; Lobre, C...
Journal of Electronic Materials.  52 (2023)  11 - p. 7081-7088 , 2023
 
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2

HgCdTe Diode Dark Current Modeling: Rule 07 Revisited for L..:

Baier, N. ; Gravrand, O. ; Lobre, C....
Journal of Electronic Materials.  48 (2019)  8 - p. 5233-5240 , 2019
 
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3

Analysis of the Electrical Properties of Different HgCdTe P..:

Mangin, L. ; Rochette, F. ; Lobre, C....
Journal of Electronic Materials.  48 (2019)  10 - p. 6084-6092 , 2019
 
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4

Shockley–Read–Hall Lifetime Study and Implication in HgCdTe..:

Gravrand, O. ; Rothman, J. ; Delacourt, B....
Journal of Electronic Materials.  47 (2018)  10 - p. 5680-5690 , 2018
 
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5

HgCdTe Detectors for Space and Science Imaging: General Iss..:

Gravrand, O. ; Rothman, J. ; Cervera, C....
Journal of Electronic Materials.  45 (2016)  9 - p. 4532-4541 , 2016
 
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6

Ultra-Low Dark Current HgCdTe Detector in SWIR for Space Ap..:

Cervera, C. ; Boulade, O. ; Gravrand, O....
Journal of Electronic Materials.  46 (2016)  10 - p. 6142-6149 , 2016
 
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7

Latest Developments in Long-Wavelength and Very-Long-Wavele..:

Baier, N. ; Cervera, C. ; Gravrand, O....
Journal of Electronic Materials.  44 (2015)  9 - p. 3144-3150 , 2015
 
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8

Characterization of the Microstructure of HgCdTe with p-Typ..:

Lobre, C. ; Jouneau, P.-H. ; Mollard, L..
Journal of Electronic Materials.  43 (2014)  8 - p. 2908-2914 , 2014
 
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9

p-on-n HgCdTe Infrared Focal-Plane Arrays: From Short-Wave ..:

Mollard, L. ; Bourgeois, G. ; Lobre, C....
Journal of Electronic Materials.  43 (2013)  3 - p. 802-807 , 2013
 
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10

Quantitative damage depth profiles in arsenic implanted HgC..:

Lobre, C. ; Jalabert, D. ; Vickridge, I....
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms.  313 (2013)  - p. 76-80 , 2013
 
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11

Validation of an Immunoassay for Detection and Quantitation..:

Lipp, Markus ; Anklam, Elke ; Stave, James W...
Journal of AOAC INTERNATIONAL.  83 (2000)  4 - p. 919-928 , 2000
 
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