Search for persons
X
?
2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) ,
12
FeRAM Recovery up to 200 Periods with Accumulated Endurance..:
, In:
?
2023 IEEE International Reliability Physics Symposium (IRPS) ,
13
Cryogenic Endurance of Anti-ferroelectric and Ferroelectric..:
, In:
?
2022 International Electron Devices Meeting (IEDM) ,
14
Novel Opposite Polarity Cycling Recovery (OPCR) of HfZrO2 A..:
, In:
?
2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) ,
15