Lozinskaya, A.
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1

Characterisation of the HEXITEC4S X-ray spectroscopic imagi..:

Veale, M.C. ; Booker, P. ; Church, I....
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment.  1025 (2022)  - p. 166083 , 2022
 
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3

Influence of temperature on the energy resolution of sensor..:

Lozinskaya, A. ; Veale, M. C. ; Kolesnikova, I....
Journal of Instrumentation.  16 (2021)  2 - p. P02026-P02026 , 2021
 
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4

X-ray microbeam characterisation of crystalline defects in ..:

Wheater, R.M. ; Jowitt, L. ; Richards, S....
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment.  999 (2021)  - p. 165207 , 2021
 
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5

Detailed analysis of quasi-ohmic contacts to high resistive..:

Lozinskaya, A. ; Chsherbakov, I. ; Kolesnikova, I....
Journal of Instrumentation.  14 (2019)  11 - p. C11026-C11026 , 2019
 
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7

Response of HR-GaAs:Cr sensors to subnanosecond X- and β-ra..:

Chsherbakov, I. ; Chsherbakov, P. ; Lozinskaya, A....
Journal of Instrumentation.  14 (2019)  12 - p. C12016-C12016 , 2019
 
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8

Characterization of GaAs:Cr sensors using the charge-integr..:

Greiffenberg, D. ; Andrä, M. ; Barten, R....
Journal of Instrumentation.  14 (2019)  5 - p. P05020-P05020 , 2019
 
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9

GaAs:Cr X-ray sensors noise characteristics investigation b..:

Chsherbakov, I. ; Kolesnikova, I. ; Lozinskaya, A....
Journal of Instrumentation.  13 (2018)  1 - p. C01030-C01030 , 2018
 
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10

Photon counting microstrip X-ray detectors with GaAs sensor:

Ruat, M. ; Andrä, M. ; Bergamaschi, A....
Journal of Instrumentation.  13 (2018)  1 - p. C01046-C01046 , 2018
 
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11

Characterisation of GaAs:Cr pixel sensors coupled to Timepi..:

Ponchut, C. ; Cotte, M. ; Lozinskaya, A....
Journal of Instrumentation.  12 (2017)  12 - p. C12023-C12023 , 2017
 
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12

MHz rate X-Ray imaging with GaAs:Cr sensors using the LPD d..:

Veale, M.C. ; Booker, P. ; Cline, B....
Journal of Instrumentation.  12 (2017)  2 - p. P02015-P02015 , 2017
 
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13

Electron mobility-lifetime and resistivity mapping of GaAs:..:

Chsherbakov, I. ; Kolesnikova, I. ; Lozinskaya, A....
Journal of Instrumentation.  12 (2017)  2 - p. C02016-C02016 , 2017
 
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14

Characterization of 4 inch GaAs:Cr wafers:

Budnitsky, D. ; Novikov, V. ; Lozinskaya, A....
Journal of Instrumentation.  12 (2017)  1 - p. C01063-C01063 , 2017
 
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