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Lua, Winson
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1

Super-resolution laser probing of integrated circuits using..:

Ravikumar, V. K. ; Chin, Jiann Min ; Lua, Winson...
Nature Communications.  13 (2022)  1 - p. , 2022
Link: https://doi.org/10.1038/..
 
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2

TR-DLS analysis on analog circuit:

Lua, Winson ; Phoa, Angeline ; Ranganathan, Gopinath...
Microelectronics Reliability.  106 (2020)  - p. 113584 , 2020
Link: https://doi.org/10.1016/..
 
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3

Characterization of 1122nm Laser for Laser Based Fault Isol..:

, In: 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA),
Somasundaram, Vasanth ; Xuan, Seah Yi ; Phoa, Angeline... - p. 1-4 , 2019
Link: https://doi.org/10.1109/..
 
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4

Root Cause Analysis on Analog Circuit Using TR-LADA:

, In: 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA),
Winson, Lua ; Angeline, Phoa ; Ranganathan, Gopinath.. - p. 1-5 , 2019
Link: https://doi.org/10.1109/..
 
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5

Super-resolution laser probing of integrated circuits using..:

Ravikumar, V. K ; Chin, Jiann Min ; Lua, Winson...
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC9440222/.  , 2022
Link: http://www.ncbi.nlm.nih...
 
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6

Super-resolution laser probing of integrated circuits using..:

V. K. Ravikumar ; Jiann Min Chin ; Winson Lua...
https://doi.org/10.1038/s41467-022-32724-z.  , 2022
Link: https://doi.org/10.1038/..
 
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