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2024 Design, Automation & Test in Europe Conference & Exhibition (DATE) ,
3
Algorithm to Technology Co-Optimization for CiM-Based Hyper..:
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2024 IEEE European Test Symposium (ETS) ,
8
MBIST-based weak bit screening method for embedded MRAM:
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2023 Design, Automation & Test in Europe Conference & Exhibition (DATE) ,
12
Smart Hammering: A practical method of pinhole detection in..:
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2023 IEEE 41st VLSI Test Symposium (VTS) ,
15