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Machida, Masatake
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1

Characterization of oxide films formed on Alloy 600 and All..:

Fujimoto, Shinji ; Kim, Whee-Sung ; Sato, Masugu...
Journal of Solid State Electrochemistry.  19 (2015)  12 - p. 3521-3531 , 2015
Link: https://doi.org/10.1007/..
 
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2

Chemical State Analysis of Si-Doped CNT on SiC by Hard X-Ra..:

Son, Jin-Young ; Machida, Masatake ; Oji, Hiroshi...
e-Journal of Surface Science and Nanotechnology.  9 (2011)  - p. 54-57 , 2011
Link: https://doi.org/10.1380/..
 
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3

Study of Charge Trap Sites in SiN Films by Hard X-ray Photo..:

Kosemura, Daisuke ; Takei, Munehisa ; Nagata, Kohki...
Japanese Journal of Applied Physics.  49 (2010)  4S - p. 04DD11 , 2010
Link: https://doi.org/10.1143/..
 
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4

Suppression Mechanism of Volume Shrinkage for SOG Film by P..:

Nagata, Kohki ; Kosemura, Daisuke ; Takei, Munehisa...
ECS Transactions.  28 (2010)  2 - p. 347-354 , 2010
Link: https://doi.org/10.1149/..
 
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5

Improvement of CVD SiO2 by Post Deposition Microwave Plasma..:

Nagata, Kohki ; Akamatsu, Hiroaki ; Kosemura, Daisuke...
ECS Transactions.  19 (2009)  9 - p. 45-51 , 2009
Link: https://doi.org/10.1149/..
 
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