Madge, R.
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2

New test paradigms for yield and manufacturability:

Madge, R.
IEEE Design and Test of Computers.  22 (2005)  3 - p. 240-246 , 2005
 
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Obtaining high defect coverage for frequency-dependent defe..:

Madge, R. ; Benware, B.R. ; Daasch, W.R.
IEEE Design & Test of Computers.  20 (2003)  5 - p. 46-53 , 2003
 
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Neighborhood selection for I/sub DDQ/ outlier screening at ..:

Daasch, W.R. ; McNames, J. ; Madge, R..
IEEE Design & Test of Computers.  19 (2002)  5 - p. 74-81 , 2002
 
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5

Letters to the Editor:

Madge, G. R. ; Moses, Catherine ; Milesky, Samuel D.
American Annals of the Deaf.  121 (1976)  6 - p. 523-524 , 1976
 
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The Murine Ia α Chains, Eαand Aα, Show a Surprisi..:

Benoist, Christophe O. ; Mathis, Diane J. ; Kanter, Madge R...
Proceedings of the National Academy of Sciences of the United States of America.  80 (1983)  2 - p. 534-538 , 1983
 
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Dietetic Internship Council:

Myers R.D., Madge L.
Journal of the American Dietetic Association.  61 (1972)  1 - p. 54-55 , 1972
 
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