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Mahajan, Somna
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1

Estimation of Scattering Loss Due to Sidewall Roughness in ..:

, In: Springer Proceedings in Physics; The Physics of Semiconductor Devices,
Jain, Deepti ; Mahajan, Somna ; Jain, Alok.. - p. 963-966 , 2019
Link: https://doi.org/10.1007/..
 
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2

Effect of Argon Plasma Treatment on Ohmic Contact Formation..:

, In: Springer Proceedings in Physics; The Physics of Semiconductor Devices,
Kapoor, Sonalee ; Laishram, Robert ; Saini, Hemant... - p. 191-198 , 2019
Link: https://doi.org/10.1007/..
 
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3

A comparative study of Ti and Cr based p-ohmic contacts on ..:

Mahajan, Somna S. ; Sharma, Abhishek ; Jain, Deepti...
Vacuum.  152 (2018)  - p. 128-131 , 2018
Link: https://doi.org/10.1016/..
 
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4

Performance enhancement of gate-annealed AlGaN/GaN HEMTs:

Mahajan, Somna S. ; Malik, Amit ; Laishram, Robert.
Journal of the Korean Physical Society.  70 (2017)  5 - p. 533-538 , 2017
Link: https://doi.org/10.3938/..
 
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5

Micro-structural evaluation of Ti/Al/Ni/Au ohmic contacts w..:

Mahajan, Somna S. ; Dhaul, Anuradha ; Laishram, Robert...
Materials Science and Engineering: B.  183 (2014)  - p. 47-53 , 2014
Link: https://doi.org/10.1016/..
 
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6

On the determination of the sp3 to sp2 ratio in diamond-lik..:

Mahajan, Somna S. ; Barshilia, H.C. ; Mehta, B.R..
Thin Solid Films.  302 (1997)  1-2 - p. 250-255 , 1997
Link: https://doi.org/10.1016/..
 
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